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US 11,988,618 B2Granted
Method and system to determine crystal structure
AssigneeFEI Company
InventorsBart Buijsse, Hans Raaijmakers, Peter Christiaan Tiemeijer
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Abstract
Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.
Claims20
A method, comprising:
- acquiring a first diffraction tilt series of a sample, wherein each diffraction pattern in the first diffraction tilt series has a first electron dose and a first magnification;
- acquiring a second diffraction tilt series of the sample, wherein each diffraction pattern in the second diffraction tilt series has a second electron dose and a second magnification;
- and
- solving a molecular structure of a crystal based on the first diffraction tilt series and the second diffraction tilt series.
1 more element
A method, comprising:
- acquiring one or more first diffraction patterns of a crystal at a first electron dose;
- acquiring one or more second diffraction patterns of the crystal at a second electron dose;
- obtaining a high-resolution dataset based on the first diffraction patterns;
- obtaining a low-resolution dataset based on the second diffraction patterns;
- generating a merged dataset by combining the high-resolution dataset and the low-resolution dataset in a reciprocal space;
- and
- solving a molecular structure of the crystal based on the merged dataset.
4 more elements
A system, comprising:
- an electron source for generating an electron beam along an optical axis;
- a sample stage for holding a sample and adjusting a sample position;
- a detector for detecting electrons transmitted through the sample;
- and
- a controller including a non-transitory memory for storing computer readable instructions, wherein by executing the computer readable instructions, the controller is configured to:
- acquire a first diffraction tilt series of the sample, wherein each diffraction pattern in the first diffraction tilt series has a first electron dose and a first magnification;
- acquire a second diffraction tilt series of the sample, wherein each diffraction pattern in the second diffraction tilt series has a second electron dose and a second magnification;
- and
- solve a molecular structure of a crystal of the sample based on the first diffraction tilt series and the second diffraction tilt series.
6 more elements
Dependencies are inferred from the claim text.