Device for Contactless Measurement of the Microstructure of Moving Material Webs

A device for contactless measurement of the microstructure of a moving material web, for example a metal strip,

• with a specified material web space area for arranging a moving material web,
• with a guide device for guiding a moving material web in the material web space area,
• with an X-ray source and a collimator for generating a collimated X-ray beam within an X-ray beam space area, wherein the X-ray beam space area defines a beam axis,
• with an overlap space area formed by the material web space area and the X-ray beam space area,
• with an energy-dispersive X-ray detector arranged on the side of the material web space area facing away from the X-ray source and having a measuring angle space area,
• wherein the measurement angle space area occupies an angle, for example of 2θ, relative to the X-ray beam space area, which is specified by the spatial direction from the overlap space area to the X-ray detector,
• wherein the collimator has an annular opening,
• wherein the X-ray beam space area is essentially cone-shaped and the cone shell defines a cone axis as the beam axis, and
• wherein the X-ray detector is arranged in the extension of the beam axis,
• wherein
• the X-ray detector is arranged at least twice the distance from the X-ray source to the material web space area.