G01N 2223/054
Small angle scatter
Official title: small angle scatter
G01N2223/054 (Small angle scatter) appears on 68 US grants and 80 published applications in this corpus.
Search patents in G01N- Granted patents
- 68
- Published applications
- 80
- Assignees
- 44
- Inventors
- 203
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 2 |
| 2014 | 0 | 2 |
| 2015 | 2 | 4 |
| 2016 | 1 | 2 |
| 2017 | 5 | 6 |
| 2018 | 2 | 3 |
| 2019 | 7 | 4 |
| 2020 | 2 | 6 |
| 2021 | 4 | 10 |
| 2022 | 6 | 6 |
| 2023 | 11 | 15 |
| 2024 | 6 | 9 |
| 2025 | 12 | 8 |
| 2026 | 9 | 2 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Image analyzer for material structure using Fourier transform and principal component analysis6 Oct 2026US 12,755,511 B2Toyota Jidosha Kabushiki Kaisha
- Methods and systems for model-less, scatterometry based measurements of semiconductor structures22 Sep 2026US 12,743,027 B2KLA Corporation
- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- Control apparatus, system, method and program11 Aug 2026US 12,704,468 B2Rigaku Corporation
- High-throughput high-pressure small-angle neutron scattering sample cells and environments4 Aug 2026US 12,699,061 B2STF Technologies, LLC
- Method and program for calculating small-angle x-ray scattering intensity distribution6 Aug 2026US 2026/0227349 A1Samsung Electronics Co., Ltd.
- System and method for measuring a sample by x-ray reflectance scatterometry19 Mar 2026US 2026/0079122 A1Nova Measuring Instruments Ltd.
- X-ray reflection analysis system applying multiple x-ray beams30 Oct 2025US 2025/0334530 A1NanoSeex Inc.
- Tool for Analysing the Chemical Composition and Structure of Nanolayers25 Sep 2025US 2025/0297973 A1Imec Vzw
- Diffractive analyzer of patient tissue11 Sep 2025US 2025/0281136 A1Arion Diagnostics, Inc.
Most cited
By later US patents
- X-ray measurement of properties of nano-particles52US 7,680,243 B2Jordan Valley Semiconductors Ltd. · 2010
- Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS)39US 9,588,066 B2ReVera Incorporated · 2017
- Dark field computed tomography imaging36US 9,761,021 B2Koninklijke Philips N. V. · 2017
- X-ray small angle optical system11US 10,429,325 B2Rigaku Corporation · 2019
- Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction9US 11,333,621 B2KLA-Tencor Corporation · 2022