G01N 2223/056
Diffraction
Official title: diffraction
G01N2223/056 (Diffraction) appears on 204 US grants and 246 published applications in this corpus.
Search patents in G01N- Granted patents
- 204
- Published applications
- 246
- Assignees
- 162
- Inventors
- 636
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 1 |
| 2013 | 2 | 4 |
| 2014 | 1 | 4 |
| 2015 | 2 | 6 |
| 2016 | 5 | 8 |
| 2017 | 6 | 15 |
| 2018 | 8 | 16 |
| 2019 | 15 | 17 |
| 2020 | 21 | 19 |
| 2021 | 11 | 27 |
| 2022 | 23 | 45 |
| 2023 | 27 | 31 |
| 2024 | 34 | 22 |
| 2025 | 23 | 20 |
| 2026 | 16 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/0566Analysing diffraction patternIndexing code76
- G01N 2223/0563Measure of energy-dispersion spectrum of diffracted radiationIndexing code20
- G01N 2223/0565Diffraction of electronsIndexing code17
- G01N 2223/0568Spectro-diffractometryIndexing code14
- G01N 2223/0561Diffraction camerasIndexing code10
Recent patents
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor15 Sep 2026US 12,736,486 B2Saudi Arabian Oil Company
- Radio wave absorber and radio wave absorbing composition15 Sep 2026US 12,738,665 B2FUJIFILM Corporation
- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- Methods and systems for x-ray scatterometry measurements employing a machine learning based electromagnetic response model14 Jul 2026US 12,680,970 B2KLA Corporation
- Apparatus for Inspecting Electrode Current Collector, Apparatus for Manufacturing Electrode, and Method for Manufacturing Electrode23 Jul 2026US 2026/0210882 A1LG Energy Solution, Ltd.
- Process for quantification of metal amino acid chelates in solutions and solids23 Jul 2026US 2026/0210919 A1Premex, Inc.
- Method for evaluating defect position in depth direction of wafer18 Jun 2026US 2026/0168944 A1Shin-Etsu Handotai Co., Ltd.
- Calculation apparatus, calculation method, program and machine-learning model generating method4 Jun 2026US 2026/0153459 A1Rigaku Corporation
- Apparatus and method for diagnosing battery8 Jan 2026US 2026/0009750 A1LG Energy Solution, Ltd.
Most cited
By later US patents
- X-ray transmission spectrometer system39US 10,295,485 B2Sigray, Inc. · 2019
- Detector for X-rays with high spatial and high spectral resolution21US 10,295,486 B2Sigray, Inc. · 2019
- Apparatus and method for X-ray analysis with hybrid control of beam divergence20US 10,782,252 B2Malvern Panalytical Limited · 2020
- Full beam metrology for X-ray scatterometry systems19US 10,775,323 B2KLA-Tencor Corporation · 2020
- X-ray analysis apparatus17US 5,406,608 AFisons Limited · 1995