G01N 2223/0563
Measure of energy-dispersion spectrum of diffracted radiation
Official title: measure of energy-dispersion spectrum of diffracted radiation
G01N2223/0563 (Measure of energy-dispersion spectrum of diffracted radiation) appears on 20 US grants and 25 published applications in this corpus.
Search patents in G01N- Granted patents
- 20
- Published applications
- 25
- Assignees
- 19
- Inventors
- 56
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 0 | 1 |
| 2018 | 1 | 2 |
| 2019 | 1 | 4 |
| 2020 | 5 | 3 |
| 2021 | 2 | 2 |
| 2022 | 1 | 3 |
| 2023 | 3 | 0 |
| 2024 | 2 | 5 |
| 2025 | 2 | 2 |
| 2026 | 3 | 1 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- X-ray diffraction method for the analysis of amorphous and semi-crystalline materials16 Jun 2026US 12,656,278 B2Danmarks Tekniske Universitet
- X-ray apparatus and method for analysing a sample17 Mar 2026US 12,578,289 B2Malvern Panalytical Limited
- X-ray analyzer with movable slit between sample and analyzing crystal13 Jan 2026US 12,523,622 B2Shimadzu Corporation
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes30 Sep 2025US 12,429,437 B2Sigray, Inc.
- X-ray detector system with at least two stacked flat Bragg diffractors28 Jan 2025US 12,209,977 B2Sigray, Inc.
- Apparatus for Inspecting Electrode Current Collector, Apparatus for Manufacturing Electrode, and Method for Manufacturing Electrode23 Jul 2026US 2026/0210882 A1LG Energy Solution, Ltd.
- Analysis System, Analysis Method, and Analysis Program12 Jun 2025US 2025/0189468 A1Hitachi High-Tech Corporation
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes8 May 2025US 2025/0146960 A1Sigray, Inc.
- X-ray analyzer31 Oct 2024US 2024/0361261 A1Shimadzu Corporation
- X-ray apparatus and method for analysing a sample12 Sep 2024US 2024/0302303 A1Malvern Panalytical Limited
Most cited
By later US patents
- X-ray detector system with at least two stacked flat Bragg diffractors5US 12,209,977 B2Sigray, Inc. · 2025
- Closed-loop control of X-ray knife edge3US 10,386,313 B2Bruker Jv Israel Ltd. · 2019
- X-ray spectroscopic analysis apparatus and elementary analysis method3US 10,948,434 B2Shimadzu Corporation · 2021
- X-ray diffraction and X-ray spectroscopy method and related apparatus2US 11,105,756 B2Ningbo Galaxy Materials Technology Co. Ltd. · 2021
- X-ray computed tomography apparatus, medical image processing apparatus and medical image processing method1US 10,001,568 B2Toshiba Medical Systems Corporation · 2018