X-ray detector system with at least two stacked flat Bragg diffractors
AssigneeSigray, Inc.
InventorsWenbing Yun, Janos Kirz
Life of this patent
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Abstract
An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.
Claims29
An apparatus comprising:
- a plurality of flat Bragg diffractors comprising at least a first flat Bragg diffractor and a second flat Bragg diffractor, the first and second flat Bragg diffractors positioned sequentially along an x-ray propagation axis of an x-ray beam comprising x-rays and having an angular beam divergence less than 30 mrad in at least one direction, the first and second flat Bragg diffractors sequentially impinged by the x-rays and configured to reflect and diffract corresponding reflected and diffracted portions of the x-rays;
- and
- an energy dispersive x-ray detector configured to receive and detect the reflected and diffracted portions from the plurality of flat Bragg diffractors.
An apparatus configured to receive an x-ray beam propagating along an x-ray propagation axis with an angular beam divergence less than 30 mrad in at least one direction substantially perpendicular to the x-ray propagation axis, the apparatus comprising:
- a plurality of sequentially stacked flat Bragg diffractors that are rigidly connected to one another with a separation between adjacent flat Bragg diffractors less than 200 millimeters, the plurality of sequentially stacked flat Bragg diffractors configured to receive the x-ray beam, each flat Bragg diffractor of the plurality of sequentially stacked flat Bragg diffractors configured to diffract a corresponding diffracted portion of the x-ray beam with a spectral overlap between the diffracted portions from different flat Bragg diffractors less than 25%;
- and
- at least one x-ray detector configured to receive and detect the diffracted portions.
Dependencies are inferred from the claim text.