X-ray apparatus and method for analysing a sample

An X-ray analysis apparatus for analysing a sample, the X-ray analysis apparatus comprising:

• a processor configured to analyse data from an X-ray detector comprising an array of detection elements;
• wherein the processor is configured to:
• receive X-ray analysis data comprising an X-ray intensity detected at a first detection element of the array of detection elements;
• calculate a detection angle based on the distance L1 between a first slit and the X-ray detector, and the position of the first detection element in the array of detection elements;
• and
• assign an X-ray intensity value measured at the first detection element to the detection angle.

A non-transitory computer readable storage medium having stored thereon a computer program comprising instructions configured to, when the program is executed by a computer, cause the computer to:

• receive X-ray analysis data generated by an X-ray detector comprising an array of detection elements, the X-ray analysis data comprising an X-ray intensity detected at a first detection element of the array of detection elements;
• calculate a detection angle based on the distance L1 between a first slit and the X-ray detector, and the position of the first detection element in the array of detection elements;
• and
• assign an X-ray intensity value measured at the first detection element to the detection angle.