US 2026/0210882 A1Published application

Apparatus for Inspecting Electrode Current Collector, Apparatus for Manufacturing Electrode, and Method for Manufacturing Electrode

AssigneeLG Energy Solution, Ltd.

InventorsSeon Hyeong Na, Ki Hoon Paeng

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Abstract

Aspects of the disclosure are directed to inspecting an electrode current collector and manufacturing an electrode with increased accuracy in evaluation of mechanical properties of the electrode current collector through non-destructive inspection. More specifically, through x-ray diffraction (XRD) analysis in selecting an electrode current collector, aspects of the disclosure allow for monitoring and/or screening mechanical properties of an electrode current collector with higher accuracy. Further, if evaluating the mechanical properties of an electrode current collector are included in the manufacturing process for the electrode, degradation in strength of the electrode current collector being heat-treated can be predicted and/or prevented, thereby resolving defects which may occur during electrode manufacturing.

Claims13

Dependent claims

An apparatus for inspecting an electrode current collector, the apparatus comprising:

a data collection unit, which is on an electrode current collector between a plurality of transfer rollers for transferring or stopping the electrode current collector in a longitudinal direction, and configured to perform XRD analysis on the electrode current collector in a stationary state to collect full-width-of-half-maximum data of a (hkl) plane;
and
a selection unit configured to select an electrode current collector having a potential density difference (α) of 0.20 or less as defined by Equation 1 below by using the above data:
α
=
(
A
⁡
(
111
)
-
B
⁡
(
111
)
A
⁡
(
1
⁢
1
⁢
1
)
)
2
+
(
A
⁡
(
200
)
-
B
⁡
(
200
)
A
⁡
(
200
)
)
2
+
(
A
⁡
(
220
)
-
B
⁡
(
220
)
A
⁡
(
2
⁢
2
⁢
0
)
)
2
+
(
A
⁡
(
311
)
-
B
⁡
(
311
)
A
⁡
(
3
⁢
1
⁢
1
)
)
2
4
[
Equation
⁢
1
]
wherein in Equation 1 above,
A(hkl) is a full width of half maximum of a (hkl) plane of a reference electrode current collector, wherein A(111)=0.089, A(200)=0.102, A(220)=0.113, and A(311)=0.138, and
B(hkl) is a full width of half maximum of a (hkl) plane of an electrode current collector to be inspected.

102 more elements

Dependencies are inferred from the claim text.

Facts

Application: 19/569,004Filed 17 Mar 2026
Priority: KR 10-2023-01338206 Oct 2023
Published: 23 Jul 2026
Term ends: Not estimatedThe source records don’t support an estimate.

Classification19 codes

G01N 23/20091
By using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the…:…
H01M 4/0404
Methods of deposition of the material: by coating on electrode collectors
G01N 23/20
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 –…: by…
G01N 23/2055
By using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the…:…