System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes

An apparatus comprising:

• an x-ray source configured to generate x-rays diverging in a first direction and diverging in a second direction substantially orthogonal to the first direction, the x-rays having a spectral intensity variation less than 10% over an energy bandwidth greater than 25 eV with at least one x-ray energy between 1 keV and 30 keV, at least some of the x-rays impinging a sample;
• at least one diffractor configured to receive and to concurrently diffract at least some of the x-rays as a function of x-ray energy in the first direction and in the second direction, wherein the at least one diffractor comprises:
• a first diffractor configured to receive the x-rays from the sample and to concurrently diffract at least some of the received x-rays as a function of x-ray energy in the first direction and in the second direction;
• and
• a second diffractor configured to receive second x-rays transmitted through the first diffractor and to concurrently diffract at least some of the received second x-rays as a function of x-ray energy in the first direction and in the second direction;
• at least one two-dimensional (2D) position-sensitive x-ray detector configured to receive at least some of the x-rays diffracted in the first direction by the at least one diffractor and at least some of the x-rays diffracted in the second direction by the at least one diffractor and to concurrently generate first spectral information of the x-rays diffracted in the first direction and second spectral information of the x-rays diffracted in the second direction;
• an electromechanical subsystem configured to position the x-ray source, the at least one diffractor, and/or the at least one 2D position-sensitive x-ray detector relative to one another;
• circuitry configured to receive the first and second spectral information from the at least one 2D position-sensitive x-ray detector and to generate a single x-ray absorption spectroscopy (XAS) spectrum using the first and second spectral information;
• and
• a sample holder configured to hold the sample between the x-ray source and the at least one diffractor or between the at least one diffractor and the at least one 2D position-sensitive x-ray detector.