X-ray analyzer with movable slit between sample and analyzing crystal

An X-ray analyzer comprising:

• an excitation source configured to irradiate a sample with an excitation beam;
• an analyzing crystal configured to diffract characteristic X-rays emitted from the sample irradiated with the excitation beam;
• a line detector having a plurality of detection elements each arranged to detect an intensity of each of a corresponding plurality of wavelengths diffracted by the analyzing crystal;
• a slit arranged between the sample and the analyzing crystal;
• a drive unit configured to move the slit in a direction intersecting a propagation direction of the characteristic X-rays passing through the slit;
• and
• a controller,
• wherein the controller analyzes the sample using a first measurement result which is a measurement result of the line detector when the slit is in a first position and a second measurement result which is a measurement result of the line detector when the slit has been moved from the first position by the driving device and is in a second position.