G01N 2223/0566
Analysing diffraction pattern
Official title: analysing diffraction pattern
G01N2223/0566 (Analysing diffraction pattern) appears on 76 US grants and 102 published applications in this corpus.
Search patents in G01N- Granted patents
- 76
- Published applications
- 102
- Assignees
- 75
- Inventors
- 243
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2006 | 0 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 2 |
| 2016 | 1 | 4 |
| 2017 | 2 | 5 |
| 2018 | 5 | 7 |
| 2019 | 2 | 5 |
| 2020 | 9 | 11 |
| 2021 | 5 | 7 |
| 2022 | 10 | 18 |
| 2023 | 7 | 16 |
| 2024 | 17 | 12 |
| 2025 | 11 | 9 |
| 2026 | 7 | 4 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Differentiation of clastic sedimentary systems using March-Dollase preferred orientation actor15 Sep 2026US 12,736,486 B2Saudi Arabian Oil Company
- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- Methods and systems for x-ray scatterometry measurements employing a machine learning based electromagnetic response model14 Jul 2026US 12,680,970 B2KLA Corporation
- Method and system for orientating a sample for inspection with charged particle microscopy21 Apr 2026US 12,607,579 B2FEI Company
- Information processing apparatus, information processing method, nontransitory computer readable media storing program, and X-ray analysis apparatus24 Mar 2026US 12,584,871 B2Rigaku Corporation
- Process for quantification of metal amino acid chelates in solutions and solids23 Jul 2026US 2026/0210919 A1Premex, Inc.
- Method for evaluating defect position in depth direction of wafer18 Jun 2026US 2026/0168944 A1Shin-Etsu Handotai Co., Ltd.
- Calculation apparatus, calculation method, program and machine-learning model generating method4 Jun 2026US 2026/0153459 A1Rigaku Corporation
- Apparatus and method for diagnosing battery8 Jan 2026US 2026/0009750 A1LG Energy Solution, Ltd.
- Image Acquisition Method and Scanning Transmission Electron Microscope20 Nov 2025US 2025/0354945 A1JEOL Ltd.
Most cited
By later US patents
- Full beam metrology for X-ray scatterometry systems19US 10,775,323 B2KLA-Tencor Corporation · 2020
- Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement system4US 10,161,888 B2Rigaku Corporation · 2018
- Generation of diffraction signature of item within object4US 10,261,212 B2Analogic Corporation · 2019
- X-ray diffraction measurement method and apparatus2US 10,591,425 B2Honda Motor Co., Ltd. · 2020
- Scanning electron microscope and method for determining crystal orientations2US 10,935,505 B2JEOL Ltd. · 2021