G01N 2223/052
Reflection
Official title: reflection
G01N2223/052 (Reflection) appears on 45 US grants and 61 published applications in this corpus.
Search patents in G01N- Granted patents
- 45
- Published applications
- 61
- Assignees
- 40
- Inventors
- 148
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 5 |
| 2018 | 0 | 3 |
| 2019 | 5 | 8 |
| 2020 | 3 | 2 |
| 2021 | 3 | 5 |
| 2022 | 6 | 7 |
| 2023 | 6 | 11 |
| 2024 | 10 | 6 |
| 2025 | 5 | 6 |
| 2026 | 3 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Information processing apparatus, information processing method, nontransitory computer readable media storing program, and X-ray analysis apparatus24 Mar 2026US 12,584,871 B2Rigaku Corporation
- Information processing apparatus, information processing method, non-transitory computer readable media storing program, and X-ray analysis apparatus3 Mar 2026US 12,566,146 B2Rigaku Corporation
- Method for determining parameters of three dimensional nanostructure and apparatus applying the same9 Dec 2025US 12,493,004 B2Industrial Technology Research Institute
- Method and apparatus for detecting aging-dictated damage or delamination on components, in particular power modules of power electronic devices, and power electronic device, in particular converter20 May 2025US 12,306,264 B2Siemens Aktiengesellschaft
- Measurement head and gauge for improved measurement stability24 Sep 2026US 2026/0287524 A1Thermo Fisher Scientific Messtechnik GmbH
- Alloy composition calculation apparatus, method, program, and system27 Aug 2026US 2026/0251586 A1Resonac Corporation
- Apparatus and method for detecting reflective electron16 Apr 2026US 2026/0104369 A1Samsung Eletronics Co., Ltd.
- Soft X-Ray Tools for Semiconductor Metrology Applications2 Apr 2026US 2026/0092883 A1yTools Inc.
- Wolter mirror assembly26 Feb 2026US 2026/0056397 A1KLA Corporation
Most cited
By later US patents
- Optical measuring device66US 7,003,075 B2Canon Kabushiki Kaisha · 2006
- Detector for X-rays with high spatial and high spectral resolution21US 10,295,486 B2Sigray, Inc. · 2019
- X-ray spectrometer and methods for use20US 11,054,375 B2University of Washington · 2021
- Magnetic field sensor with error calculation14US 10,837,943 B2Allegro MicroSystems, LLC · 2020
- System and method using x-rays for depth-resolving metrology and analysis12US 11,549,895 B2Sigray, Inc. · 2023