G01N 2223/053
Back scatter
Official title: back scatter
G01N2223/053 (Back scatter) appears on 111 US grants and 121 published applications in this corpus.
Search patents in G01N- Granted patents
- 111
- Published applications
- 121
- Assignees
- 72
- Inventors
- 278
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 2 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 1 |
| 2009 | 2 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 1 | 1 |
| 2013 | 0 | 2 |
| 2014 | 1 | 2 |
| 2015 | 4 | 3 |
| 2016 | 5 | 4 |
| 2017 | 5 | 8 |
| 2018 | 1 | 1 |
| 2019 | 4 | 5 |
| 2020 | 9 | 12 |
| 2021 | 13 | 20 |
| 2022 | 9 | 17 |
| 2023 | 13 | 13 |
| 2024 | 11 | 10 |
| 2025 | 14 | 9 |
| 2026 | 9 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Detection systems with scintillator-based filtering16 Jun 2026US 12,656,520 B2American Science and Engineering, Inc.
- Method and system for orientating a sample for inspection with charged particle microscopy21 Apr 2026US 12,607,579 B2FEI Company
- Proximity sensor for electron backscatter diffraction systems7 Apr 2026US 12,596,082 B2Bruker Nano, Inc.
- System, method, and apparatus for x-ray backscatter inspection of parts17 Feb 2026US 12,553,839 B2The Boeing Company
- Computer-assisted method for determining an element fraction of a determination element having a small atomic number, in particular a Li fraction, and corresponding device for processing data17 Feb 2026US 12,553,840 B2Gatan, Inc.
- Device for Contactless Measurement of the Microstructure of Moving Material Webs1 Oct 2026US 2026/0298848 A1IMS Messsysteme GmbH
- Backscatter Scanning Systems with Different Detector Panel Configurations17 Sep 2026US 2026/0276858 A1American Science and Engineering, Inc.
- Backscatter detector and backscatter detection apparatus including backscatter detector25 Jun 2026US 2026/0177511 A1Nuctech Company Limited
- Method of identifying material and apparatus of identifying material4 Jun 2026US 2026/0153457 A1Nuctech Company Limited
- Apparatus and method for improved electron beam inspection with programmable angle and energy detection5 Mar 2026US 2026/0063576 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors62US 8,831,176 B2Rapiscan Systems, Inc. · 2014
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- System and kit for x-ray backscatter imaging with removable detector27US 10,794,843 B2Viken Detection Corporation · 2020
- Method of and apparatus for sensing the ash content of coal26US 4,486,894 ACoal Industry (Patents) Limited · 1984
- High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors24US 9,465,135 B2Rapiscan Systems, Inc. · 2016