System, method, and apparatus for x-ray backscatter inspection of parts
AssigneeThe Boeing Company
InventorMorteza Safai
Life of this patent
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AssigneeThe Boeing Company
InventorMorteza Safai
Estimating the term…
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus includes an x-ray source and an x-ray collimator. The x-ray collimator includes a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further includes an x-ray intensity sensor that is fixed to the x-ray collimator over the detection aperture such that at least a portion of an uncollimated x-ray emission, collimated into the detection aperture, is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally includes an emission alignment adjuster that is operable to adjust a position of the uncollimated x-ray emission relative to the plurality of emission apertures and the detection aperture in response to the at least the portion of the uncollimated x-ray emission detected by the x-ray intensity sensor.
An x-ray backscatter apparatus for non-destructive inspection of a part, the x-ray backscatter apparatus comprising:
An x-ray backscatter system for non-destructive inspection of a part, the x-ray backscatter system comprising:
A method of non-destructive inspection of a part, the method comprising steps of:
Dependencies are inferred from the claim text.