G01N 2223/50
Detectors
G01N2223/50 (Detectors) appears on 473 US grants and 576 published applications in this corpus.
Search patents in G01N- Granted patents
- 473
- Published applications
- 576
- Assignees
- 281
- Inventors
- 1,313
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 2 | 4 |
| 2007 | 2 | 4 |
| 2008 | 3 | 5 |
| 2009 | 5 | 7 |
| 2010 | 3 | 1 |
| 2011 | 2 | 2 |
| 2012 | 3 | 4 |
| 2013 | 1 | 7 |
| 2014 | 7 | 13 |
| 2015 | 7 | 13 |
| 2016 | 11 | 16 |
| 2017 | 13 | 35 |
| 2018 | 14 | 25 |
| 2019 | 40 | 26 |
| 2020 | 38 | 51 |
| 2021 | 44 | 93 |
| 2022 | 57 | 75 |
| 2023 | 54 | 59 |
| 2024 | 58 | 51 |
| 2025 | 57 | 39 |
| 2026 | 38 | 46 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 2223/501ArrayIndexing code163
- G01N 2223/505ScintillationIndexing code148
- G01N 2223/507Secondary-emission detectorIndexing code99
- G01N 2223/506Time-of-flightIndexing code7
- G01N 2223/503Auxiliary reference detectorIndexing code6
- G01N 2223/509InfraredIndexing code5
- G01N 2223/508Photo-acousticIndexing code4
- G01N 2223/502Ionisation chamberIndexing code3
All 9 subgroupsShow fewer
Recent patents
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- Apparatus for analyzing composition and method thereof6 Oct 2026US 12,754,152 B23I Solution Inc.
- Inference of bright flat-field correction based on scan radiographs6 Oct 2026US 12,755,344 B2Lumafield, Inc.
- Nanophotonic scintillators for high-energy particles detection, imaging, and spectroscopy29 Sep 2026US 12,748,060 B2Massachusetts Institute of Technology
- Charged particle beam device and specimen observation method15 Sep 2026US 12,738,442 B2Hitachi High-Tech Corporation
- X-ray inspection apparatus8 Oct 2026US 2026/0309648 A1Anritsu Corporation
- Curved edge radiation detector, collimator, and imaging system including same1 Oct 2026US 2026/0299143 A1Varex Imaging Corporation
- Threshold voltage stabilizing system and method17 Sep 2026US 2026/0276561 A1Varex Imaging Corporation
- High-speed ct scanner system with x-ray tube producing linear x-ray sources17 Sep 2026US 2026/0276564 A1Medichord LLC
- Backscatter Scanning Systems with Different Detector Panel Configurations17 Sep 2026US 2026/0276858 A1American Science and Engineering, Inc.
Most cited
By later US patents
- X-ray tomography inspection systems98US 7,876,879 B2Rapiscan Systems, Inc. · 2011
- X-ray tomography inspection systems74US 8,135,110 B2Rapiscan Systems, Inc. · 2012
- Dual-energy x-ray detector providing spatial and temporal interpolation73US 5,841,832 ALunar Corporation · 1998
- High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source67US 7,130,375 B1Xradia, Inc. · 2006
- Hidden explosives detector employing pulsed neutron and x-ray interrogation63US 5,200,626 AMartin Marietta Energy Systems, Inc. · 1993