High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
AssigneeXradia, Inc.
InventorsWenbing Yun, David Dean Scott, David R. Trapp, Frederick William Duewer, Yuxin Wang
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Abstract
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
Claims18
An x ray imaging system, comprising:
- a projection x ray stage including
- an x ray source generating a diverging x ray beam;
- and
- a scintillator for converting the x ray beam, after interacting with a sample, into an optical signal;
- an optical stage including:
- a detector;
- and
- a magnification lens for imaging the optical signal of the scintillator onto the detector;
- a motion stage for adjusting a distance between the scintillator and the magnification lens.
An x ray imaging system comprising:
- a projection x ray stage including
- an x ray source generating a diverging x ray beam;
- and
- a scintillator for converting the diverging x ray beam, after interacting with a sample, into an optical signal;
- and
- a sample holder for holding and positioning the sample in proximity to the scintillator, the sample holder comprising:
- a rotation motion stage for rotating the sample in the x ray beam;
- x-y-z axis motion stages to center the sample's region of interest at the rotation axis of the rotation stage;
- z-axis motion stages for adjusting a source-to-sample distance and a sample-to-detector distance;
- and
- a scintillator motion stage for adjusting a distance between the scintillator and an optical magnification lens.
Dependencies are inferred from the claim text.