G01N 2223/505
Scintillation
Official title: scintillation
G01N2223/505 (Scintillation) appears on 148 US grants and 161 published applications in this corpus.
Search patents in G01N- Granted patents
- 148
- Published applications
- 161
- Assignees
- 86
- Inventors
- 329
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 2 | 1 |
| 2007 | 0 | 1 |
| 2008 | 1 | 2 |
| 2009 | 2 | 0 |
| 2010 | 0 | 1 |
| 2011 | 1 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 2 | 2 |
| 2015 | 0 | 4 |
| 2016 | 4 | 6 |
| 2017 | 4 | 13 |
| 2018 | 4 | 8 |
| 2019 | 17 | 9 |
| 2020 | 14 | 18 |
| 2021 | 18 | 25 |
| 2022 | 13 | 17 |
| 2023 | 17 | 15 |
| 2024 | 11 | 10 |
| 2025 | 14 | 13 |
| 2026 | 16 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Overlay target measurement and shift compensation in charged particle systems and related methods6 Oct 2026US 12,754,150 B2Applied Materials Israel Ltd.
- Inference of bright flat-field correction based on scan radiographs6 Oct 2026US 12,755,344 B2Lumafield, Inc.
- Nanophotonic scintillators for high-energy particles detection, imaging, and spectroscopy29 Sep 2026US 12,748,060 B2Massachusetts Institute of Technology
- Charged particle beam device and specimen observation method15 Sep 2026US 12,738,442 B2Hitachi High-Tech Corporation
- Target X-ray inspection system and method1 Sep 2026US 12,723,994 B2Viken Detection Corporation
- Backscatter Scanning Systems with Different Detector Panel Configurations17 Sep 2026US 2026/0276858 A1American Science and Engineering, Inc.
- Secondary image removal using high resolution x-ray transmission sources10 Sep 2026US 2026/0266745 A1Sigray, Inc.
- Apparatus and system30 Jul 2026US 2026/0219209 A1Canon Kabushiki Kaisha
- X-ray detector assembly, x-ray imaging system and method for manufacturing an x-ray detector assembly16 Jul 2026US 2026/0202557 A1
- Systems and methods for reducing interference in radiation portal monitors18 Jun 2026US 2026/0168940 A1Smiths Detection Inc.
Most cited
By later US patents
- Dual-energy x-ray detector providing spatial and temporal interpolation73US 5,841,832 ALunar Corporation · 1998
- High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source67US 7,130,375 B1Xradia, Inc. · 2006
- High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source52US 7,400,704 B1Xradia, Inc. · 2008
- Device for detecting secondary electrons in a scanning electron microscope29US 4,442,355 AJEOL Ltd. · 1984
- Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors18US 10,670,740 B2American Science and Engineering, Inc. · 2020