G01N 2223/08
Incident electron beam and measuring cathode luminescence
Official title: incident electron beam and measuring cathode luminescence (U.V.)
G01N2223/08 (Incident electron beam and measuring cathode luminescence) appears on 10 US grants and 12 published applications in this corpus.
Search patents in G01N- Granted patents
- 10
- Published applications
- 12
- Assignees
- 11
- Inventors
- 32
- Latest grant
- 4 Feb 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 1 | 0 |
| 2019 | 0 | 1 |
| 2020 | 1 | 1 |
| 2021 | 0 | 2 |
| 2022 | 1 | 3 |
| 2023 | 1 | 0 |
| 2024 | 2 | 1 |
| 2025 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- ULED chip, uLED substrate and method for manufacturing the same, el inspection method for uLED substrate, and el inspection apparatus4 Feb 2025US 12,218,273 B2Boe Technology Group Co., Ltd.
- Method for improving an EBSD/TKD map26 Mar 2024US 11,940,396 B2Bruker Nano, Inc.
- Radiation detection device, recording medium, and positioning method26 Mar 2024US 11,940,397 B2Horiba, Ltd.
- Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements10 Oct 2023US 11,782,001 B2Attolight AG
- Method of examining a sample using a charged particle microscope6 Dec 2022US 11,519,871 B2FEI Company
- Optical apparatus5 Jun 2025US 2025/0180486 A1Renishaw PLC
- Surface characterization of materials using cathodoluminescence18 Apr 2024US 2024/0125718 A1Silanna UV Technologies Pte Ltd
- Uled chip, uled substrate and method for manufacturing the same, el inspection method for uled substrate, and el inspection apparatus1 Dec 2022US 2022/0384677 A1Boe Technology Group Co., Ltd.
- Method for improving an ebsd/tkd map14 Jul 2022US 2022/0221412 A1Bruker Nano, Inc.
- Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements9 Jun 2022US 2022/0178854 A1Attolight AG
Most cited
By later US patents
- Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment14US 8,334,510 B2B-Nano Ltd. · 2012
- Apparatus for determining the density of unoccupied electronic states of a material3US 4,472,634 ACommissariat A L' Energie Atomique · 1984
- Method and device for measuring unoccupied states of solid2US 9,664,564 B2Kyoto University · 2017
- Method of examining a sample using a charged particle microscope1US 11,519,871 B2FEI Company · 2022