G01N 2223/086
Auger electrons
G01N2223/086 (Auger electrons) appears on 4 US grants and 4 published applications in this corpus.
Search patents in G01N- Granted patents
- 4
- Published applications
- 4
- Assignees
- 5
- Inventors
- 12
- Latest grant
- 16 May 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Time-dependent defect inspection apparatus16 May 2023US 11,651,935 B2ASML Netherlands B. V.
- Time-dependent defect inspection apparatus6 Jul 2021US 11,056,311 B2ASML Netherlands B. V.
- In-situ differential spectroscopy9 Oct 2012US 8,283,631 B2KLA-Tencor Corporation
- Electron spectroscopy analyzer and a method of correcting a shift of spectral line in electron spectroscopy4 Oct 1994US 5,352,894 ASharp Kabushiki Kaisha
- Bonding wire for semiconductor devices4 Dec 2025US 2025/0372565 A1Nippon Micrometal Corporation
- Time-dependent defect inspection apparatus6 Jan 2022US 2022/0005666 A1ASML Netherlands B. V.
- Time-dependent defect inspection apparatus5 Mar 2020US 2020/0075287 A1ASML Netherlands B. V.
- In-Situ Differential Spectroscopy12 Nov 2009US 2009/0278044 A1KLA-Tencor Corporation
Most cited
By later US patents