G01N 2223/072
Combination of measurements, 2 kinds of secondary emission
Official title: combination of measurements, 2 kinds of secondary emission
G01N2223/072 (Combination of measurements, 2 kinds of secondary emission) appears on 18 US grants and 22 published applications in this corpus.
Search patents in G01N- Granted patents
- 18
- Published applications
- 22
- Assignees
- 20
- Inventors
- 63
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 2 |
| 2016 | 2 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 2 |
| 2020 | 1 | 2 |
| 2021 | 0 | 3 |
| 2022 | 3 | 2 |
| 2023 | 2 | 6 |
| 2024 | 1 | 1 |
| 2025 | 3 | 1 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Method for analyzing quality of thin surface layer of PCB19 May 2026US 12,631,580 B2Guangzhou Termbray Electronics Tech Co., Ltd.
- Computer-assisted method for determining an element fraction of a determination element having a small atomic number, in particular a Li fraction, and corresponding device for processing data17 Feb 2026US 12,553,840 B2Gatan, Inc.
- System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers9 Sep 2025US 12,411,098 B2Bruker AXS GmbH
- Method and system for stress testing of materials using laser accelerated particles13 May 2025US 12,298,263 B2Institut National De La Recherche Scientifique
- Patterned x-ray emitting target2 Jan 2025US 2025/0006451 A1Nova Measuring Instruments Ltd.
- Methods and systems for elemental mapping26 Dec 2024US 2024/0429018 A1FEI Company
- System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers16 Nov 2023US 2023/0366840 A1Bruker AXS GmbH
- Computer-assisted method for determining an element fraction of a determination element having a small atomic number, in particular a li fraction, and corresponding device for processing data21 Sep 2023US 2023/0296540 A1Gatan, Inc.
- Reducing backscattered electron induced errors24 Aug 2023US 2023/0267574 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- Nondestructive sample imaging7US 10,468,230 B2BAE Systems Information and Electronic Systems Integration Inc. · 2019
- X-ray spectrometer3US 4,280,049 AU. S. Philips Corporation · 1981
- Process for performing automated mineralogy3US 9,194,829 B2FEI Company · 2015
- Magnetic material observation method, and magnetic material observation apparatus2US 11,474,169 B2National Institutes for Quantum Science and Technology · 2022
- Patterned x-ray emitting target2US 11,996,259 B2Nova Measuring Instruments Ltd. · 2024