G01N 2223/079
Incident electron beam and measuring excited x-rays
Official title: incident electron beam and measuring excited X-rays
G01N2223/079 (Incident electron beam and measuring excited x-rays) appears on 72 US grants and 90 published applications in this corpus.
Search patents in G01N- Granted patents
- 72
- Published applications
- 90
- Assignees
- 49
- Inventors
- 201
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 2 | 0 |
| 2013 | 0 | 1 |
| 2014 | 1 | 3 |
| 2015 | 1 | 0 |
| 2016 | 2 | 3 |
| 2017 | 5 | 5 |
| 2018 | 4 | 4 |
| 2019 | 2 | 5 |
| 2020 | 5 | 13 |
| 2021 | 9 | 9 |
| 2022 | 11 | 12 |
| 2023 | 6 | 10 |
| 2024 | 4 | 10 |
| 2025 | 9 | 5 |
| 2026 | 6 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Analyzing method and analyzer19 May 2026US 12,631,578 B2JEOL Ltd.
- Spectrum analysis apparatus and database creation method19 May 2026US 12,631,581 B2JEOL Ltd.
- X-ray spectrum analysis apparatus and method12 May 2026US 12,625,097 B2JOEL Ltd.
- Material analysis with multiple detectors21 Apr 2026US 12,607,581 B2Oxford Instruments Nanotechnology Tools Limited
- Method for classifying unknown particles on a surface of a semi-conductor wafer7 Apr 2026US 12,596,062 B2Siltronic AG
- Tomographic imaging system geometry to mitigate artifacts1 Oct 2026US 2026/0298845 A1
- Crystal evaluation method17 Sep 2026US 2026/0282842 A1Kioxia Corporation
- Method and Apparatus for Analysis27 Aug 2026US 2026/0251597 A1JEOL Ltd.
- Analysis device20 Aug 2026US 2026/0243663 A1Keyence Corporation
- Layer separation for e-beam overlay metrology14 May 2026US 2026/0133149 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment14US 8,334,510 B2B-Nano Ltd. · 2012
- Nondestructive sample imaging7US 10,468,230 B2BAE Systems Information and Electronic Systems Integration Inc. · 2019
- X-ray analysis apparatus and x-ray generation unit6US 11,467,107 B2Horiba, Ltd. · 2022
- Method for nondestructive fuel assay of laser fusion targets6US 3,940,617 AThe United States of America as represented by the United States Energy Research and Development Administration · 1976