G01N 2223/081
Incident ion beam
Official title: incident ion beam, e.g. proton
G01N2223/081 (Incident ion beam) appears on 15 US grants and 27 published applications in this corpus.
Search patents in G01N- Granted patents
- 15
- Published applications
- 27
- Assignees
- 21
- Inventors
- 72
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 0 |
| 2019 | 1 | 0 |
| 2020 | 0 | 1 |
| 2021 | 0 | 2 |
| 2022 | 1 | 3 |
| 2023 | 1 | 5 |
| 2024 | 0 | 2 |
| 2025 | 4 | 5 |
| 2026 | 3 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Particle-induced x-ray emission using light and heavy particle beams11 Aug 2026US 12,704,469 B2FEI Company
- System and method for modeling a rock sample4 Aug 2026US 12,699,817 B2Saudi Arabian Oil Company
- Method for analyzing quality of thin surface layer of PCB19 May 2026US 12,631,580 B2Guangzhou Termbray Electronics Tech Co., Ltd.
- Lithium detection techniques using neutrons and/or alpha particles17 Jun 2025US 12,332,400 B2Schlumberger Technology Corporation
- Standard sample film, method for producing standard sample film, standard sample, sample set, quantitative analysis method, and transfer film10 Jun 2025US 12,326,418 B2FUJIFILM Corporation
- Adaptive fudicials for mult-modal radiotherapy17 Sep 2026US 2026/0272604 A2IZI Medical Products
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- Surface mass spectrometry device9 Jul 2026US 2026/0194478 A1
- Adaptive fudicials for multi-modal radiotherapy5 Mar 2026US 2026/0060776 A1IZI Medical Products
- Method and system for 3d reconstruction of wafer structure by diagonal milling25 Dec 2025US 2025/0391707 A1Applied Materials Israel Ltd.
Most cited
By later US patents
- Mass spectrometer having means for observing the radiation emitted when ions collide with a target gas7US 5,347,125 AFisons Limited · 1994
- Pulsed field sample neutralization6US 4,968,888 AThe United States of America as represented by the United States Department of Energy · 1990
- Charged particle energy analyzer4US 4,546,254 AShimadzu Corporation · 1985
- Electrical measurements in samples3US 7,148,478 B2Yeda Research and Development Co. Ltd. · 2006
- Composite charged particle beam apparatus1US 9,024,280 B2Hitachi High-Tech Science Corporation · 2015