G01N 2223/0816
Incident ion beam and measuring secondary ion beam [sims]
Official title: incident ion beam and measuring secondary ion beam [SIMS]
G01N2223/0816 (Incident ion beam and measuring secondary ion beam [sims]) appears on 6 US grants and 8 published applications in this corpus.
Search patents in G01N- Granted patents
- 6
- Published applications
- 8
- Assignees
- 8
- Inventors
- 30
- Latest grant
- 10 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 1 |
| 2018 | 0 | 0 |
| 2019 | 1 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 1 | 1 |
| 2023 | 0 | 1 |
| 2024 | 0 | 0 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Standard sample film, method for producing standard sample film, standard sample, sample set, quantitative analysis method, and transfer film10 Jun 2025US 12,326,418 B2FUJIFILM Corporation
- Charged particle beam irradiation apparatus and control method23 Aug 2022US 11,424,100 B2Hitachi High-Tech Science Corporation
- Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique19 Nov 2019US 10,481,109 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Composite charged particle beam apparatus5 May 2015US 9,024,280 B2Hitachi High-Tech Science Corporation
- Pulsed field sample neutralization6 Nov 1990US 4,968,888 AThe United States of America as represented by the United States Department of Energy
- Surface mass spectrometry device9 Jul 2026US 2026/0194478 A1
- Multi-electron beam inspection device and multi-electron beam inspection method1 Jun 2023US 2023/0170183 A1NuFlare Technology, Inc.
- Standard sample film, method for producing standard sample film, standard sample, sample set, quantitative analysis method, and transfer film1 Dec 2022US 2022/0381737 A1FUJIFILM Corporation
- Charged particle beam irradiation apparatus and control method25 Mar 2021US 2021/0090855 A1Hitachi High-Tech Science Corporation
- Method for characterizing a sample combining an x-ray characterization technique and a secondary ionization mass spectrometry characterization technique3 Aug 2017US 2017/0219502 A1Commissariat A L' Energie Atomique Et Aux Energies Alternatives
Most cited
By later US patents
- Pulsed field sample neutralization6US 4,968,888 AThe United States of America as represented by the United States Department of Energy · 1990
- Charged particle energy analyzer4US 4,546,254 AShimadzu Corporation · 1985
- Composite charged particle beam apparatus1US 9,024,280 B2Hitachi High-Tech Science Corporation · 2015