Electrical measurements in samples

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying variable electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising at least one of the following:
• irradiating the circuit by low energy charged particles, subjecting the circuit to an external field affecting the flux of emitted internal charged particles, and applying bias voltage to the back contact of the sample;
• (iii) during the variable power supply to the sample, measuring an electric current through the sample, and measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample, thereby enabling determination of spectrally resolved I–V characteristic of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying variable electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising at least one of the following:
• irradiating the circuit by low energy charged particles, subjecting the circuit to an external field affecting the flux of emitted internal charged particles, and applying bias voltage to the back contact of the sample;
• (iii) during the variable power supply to the sample, measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample, thereby enabling determination of spectrally resolved I–V characteristic of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising irradiating the sample by low energy charged particles, and carrying out at least one of the following:
• supplying a bias voltage to the back contact of the sample, and subjecting the sample to an external field affecting the flux of emitted internal charged particles;
• (iii) during the electric power supply to the sample, measuring the emitted charged particles versus their energy, and thereby extracting local potential values at chemical entities of the sample and enabling evaluation of a work function characteristic of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising irradiating the sample by low energy charged particles, and carrying out at least one of the following:
• supplying a bias voltage to the back contact of the sample, and subjecting the sample to an external field affecting the flux of emitted internal charged particles;
• (iii) during the electric power supply to the sample, measuring an electric current through the sample and measuring the emitted charged particles versus their energy, and thereby extracting local potential values at chemical entities of the sample and enabling evaluation of a work function characteristic of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising at least one of the following:
• irradiating the sample by low energy charged particles, applying bias voltage to the back contact of the sample, and subjecting the circuit to an external field affecting the flux of emitted internal charged particles;
• (iii) during the electric power supply, measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample, thereby enabling characterization of electric leakage or breakdown conditions of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising at least one of the following:
• irradiating the circuit by low energy charged particles, applying bias voltage to the back contact of the sample, and subjecting the circuit to an external field affecting the flux of emitted internal charged particles;
• (iii) during the power supply to the sample, measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample;
• thereby enabling characterization of accumulation of charge within at least one region of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising irradiating the circuit by low energy charged particles, and applying bias voltage to the back contact of the sample;
• (iii) during the power supply to the sample, measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample;
• thereby enabling characterization of accumulation of charge within at least one region of the sample.

A method for measuring the electrical properties of a sample, the method comprising:

• (i) exciting the sample with high energy radiation to cause emission of internal charged particles from the sample;
• (ii) supplying electrical power to a circuit formed by the sample and any added component connected to a back contact of the sample, said supplying of electric power comprising at least one of the following:
• irradiating the circuit by low energy charged particles, subjecting the circuit to an external field affecting the flux of emitted internal charged particles, and supplying a bias voltage to the back contact of the sample;
• (iii) affecting the sample by external electromagnetic radiation;
• (iv) during the power supply to the sample and illumination of the sample, measuring the emitted charged particles versus their energy thereby extracting local potential values at chemical entities of the sample;
• thereby enabling determination of at least one of photo voltage and photo current of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising at least one of the following:
• a source of charged particles operable to irradiate the sample with a beam of low energy charged particles;
• a source of an external field affecting the flux of the emitted charged particles;
• and a voltage supply unit operable to supply bias voltage to the back contact of the sample;
• and
• (c) a detection system including at least one of the following:
• a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy, and thus extracting local potentials of different chemical entities in the sample and generating measured data indicative thereof;
• and an ampermeter for measuring an electric current through the sample;
• the device being thereby operable for providing at least one of the following:
• determination of spectrally resolved I–V characteristic of the sample;
• evaluation of a work function characteristic of the sample;
• characterization of electric leakage or breakdown conditions of the sample;
• and characterization of accumulation of charge within at least one region of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising at least one of the following:
• a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, a source of external field for affecting the flux of the emitted charged particles, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• (c) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for determining a spectrally resolved I–V characteristic of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising at least one of the following:
• a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, a source of external field for affecting the flux of the emitted charged particles, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• (c) a detection system including:
• a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof, and at least one ampermeter for measuring an electric current through the sample;
• the device being therefore operable for determining a spectrally resolved I–V characteristic of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an illumination assembly operable to affect the sample by external electromagnetic radiation;
• (c) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising at least one of the following:
• a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, a source of external field for affecting the flux of emitted charged particles, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• (d) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• and
• the device being therefore operable for determining at least one of photo voltage and photo current of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an illumination assembly operable to affect the sample by external electromagnetic radiation;
• (c) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising at least one of the following:
• a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, a source of external field for affecting the flux of emitted charged particles, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• (d) a detection system including:
• a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• and at least one ampermeter for measuring an electric current through the sample;
• the device being therefore operable for determining at least one of photo voltage and photo current of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and at least one of the following:
• a voltage supply unit for supplying bias voltage to the back contact of the sample, and a source of external field for affecting the flux of the emitted charged particles;
• (c) a detection system including:
• a voltmeter for accommodating at a distance from the circuit and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for evaluating a work function of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and at least one of the following:
• a voltage supply unit for supplying bias voltage to the back contact of the sample, and a source of external field for affecting the flux of the emitted charged particles;
• (c) a detection system including:
• a voltmeter for accommodating at a distance from the circuit and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• and at least one ampermeter for measuring an electric current through the sample;
• the device being therefore operable for evaluating a work function of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and at least one of the following:
• a voltage supply unit for supplying bias voltage to the back contact of the sample, and a source of external field for affecting the flux of the emitted charged particles;
• and
• (c) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for providing characterization of electric leakage or breakdown conditions of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• and
• (c) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for providing characterization of electric leakage or breakdown conditions of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and at least one of the following:
• a voltage supply unit for supplying bias voltage to the back contact of the sample, and a source of external field for affecting the flux of the emitted charged particles;
• and
• (c) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for providing characterization of accumulation of charge within at least one region of the sample.

A device for use in measuring electrical properties of a sample, the device comprising:

• (a) an excitation source configured and operable to generate high energy radiation to be applied to the sample to cause emission of internal charged particles from the sample;
• (b) an electric power supply system associated with a circuit formed by the sample and any added component connected to a back contact of the sample, said electric power supply system comprising a source of charged particles operable to irradiate the sample with a low energy charged particles' beam, and a voltage supply unit for supplying bias voltage to the back contact of the sample;
• and
• (c) a detection system including a voltmeter for accommodating at a distance from the sample and comprising a charged particles' spectrometer for contactless detecting and analyzing the emitted charged particles versus their energy and therefore extracting local potentials of different chemical entities in the sample, and generating measured data indicative thereof;
• the device being therefore operable for providing characterization of accumulation of charge within at least one region of the sample.