G01N 2223/085
Photo-electron spectrum [esca, xps]
Official title: photo-electron spectrum [ESCA, XPS]
G01N2223/085 (Photo-electron spectrum [esca, xps]) appears on 26 US grants and 32 published applications in this corpus.
Search patents in G01N- Granted patents
- 26
- Published applications
- 32
- Assignees
- 25
- Inventors
- 82
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 2 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 1 |
| 2019 | 1 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 4 |
| 2022 | 1 | 6 |
| 2023 | 4 | 4 |
| 2024 | 3 | 3 |
| 2025 | 5 | 7 |
| 2026 | 3 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Method for characterizing energy level of core/shell nanoparticle12 May 2026US 12,625,099 B2Korea Research Institute of Standards and Science
- Smart systems and methods for identification and processing of spent lithium cells13 Jan 2026US 12,521,766 B1Li Industries, Inc.
- Work function measurements for surface analysis25 Nov 2025US 12,480,897 B2Cozai Ltd
- Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS15 Jul 2025US 12,359,911 B2Samsung Electronics Co., Ltd.
- Smart systems and methods for identification and processing of spent lithium cells9 Jul 2026US 2026/0194476 A1Li Industries, Inc.
- Electron spectroscopy apparatus and methods26 Mar 2026US 2026/0088243 A1
- X-ray optical device and x-ray photoelectron spectroscopy27 Nov 2025US 2025/0362256 A1Rigaku Corporation
- Characterizing and measuring in small boxes using xps with multiple measurements9 Oct 2025US 2025/0314487 A1Nova Measuring Instruments Ltd.
- Nondestructive determination of coating material composition2 Oct 2025US 2025/0305920 A1The Boeing Company
Most cited
By later US patents
- Spectrometer and method of spectroscopy19US 6,104,029 AVG Systems Limited · 2000
- Electron spectroscopy apparatus14US 5,569,916 AAgency of Industrial Science & Technology, Ministry of International Trade & Industry · 1996
- System and method using x-rays for depth-resolving metrology and analysis12US 11,549,895 B2Sigray, Inc. · 2023
- Apparatus for charged particle spectroscopy11US 4,255,656 AKratos LLC · 1981
- Charged particle energy analyzer4US 4,546,254 AShimadzu Corporation · 1985