G01N 2223/071
Combination of measurements, at least 1 secondary emission
Official title: combination of measurements, at least 1 secondary emission
G01N2223/071 (Combination of measurements, at least 1 secondary emission) appears on 62 US grants and 64 published applications in this corpus.
Search patents in G01N- Granted patents
- 62
- Published applications
- 64
- Assignees
- 61
- Inventors
- 180
- Latest grant
- 28 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 3 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 1 |
| 2013 | 0 | 1 |
| 2014 | 1 | 2 |
| 2015 | 2 | 2 |
| 2016 | 1 | 4 |
| 2017 | 4 | 4 |
| 2018 | 3 | 0 |
| 2019 | 2 | 3 |
| 2020 | 4 | 5 |
| 2021 | 3 | 7 |
| 2022 | 5 | 13 |
| 2023 | 9 | 9 |
| 2024 | 11 | 6 |
| 2025 | 4 | 5 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for calibrating a PET scanner28 Jul 2026US 12,693,441 B2Shanghai United Imaging Healthcare Co., Ltd.
- Overlay measurement system and overlay measurement device for overlay error measurement using electron microscopy8 Jul 2025US 12,354,829 B2Hitachi High-Tech Corporation
- Pulsed neutron apparatus and method for using same to analyze core samples17 Jun 2025US 12,332,193 B2Core Laboratories LP
- X-ray analysis system and method with multi-source design6 May 2025US 12,292,396 B2Shenzhen Angstrom Excellence Technology Co. Ltd
- Inspection apparatus and inspection method4 Mar 2025US 12,241,848 B2Canon Anelva Corporation
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Method and System for Detecting a Material14 Aug 2025US 2025/0258116 A1Viken Detection Corporation
- Analysis System, Analysis Method, and Analysis Program26 Jun 2025US 2025/0208076 A1Hitachi High-Tech Corporation
- X-ray analysis apparatus1 May 2025US 2025/0137947 A1Hitachi High-Tech Science Corporation
- Adaptive slice depth in slice & view workflow3 Apr 2025US 2025/0112024 A1FEI Company
Most cited
By later US patents
- Hidden explosives detector employing pulsed neutron and x-ray interrogation63US 5,200,626 AMartin Marietta Energy Systems, Inc. · 1993
- Apparatus and method for detecting explosives49US 3,997,787 A1976
- Method and apparatus for material analysis43US 4,476,386 ACommonwealth Scientific and Industrial Research Organization · 1984
- Method of and apparatus for sensing the ash content of coal26US 4,486,894 ACoal Industry (Patents) Limited · 1984
- Sheet printed with invisible inks25US 4,322,466 ALockley Services Pty. Ltd. · 1982