G01N 2223/073
Use of a laser
Official title: use of a laser
G01N2223/073 (Use of a laser) appears on 7 US grants and 6 published applications in this corpus.
Search patents in G01N- Granted patents
- 7
- Published applications
- 6
- Assignees
- 11
- Inventors
- 35
- Latest grant
- 23 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 1 |
| 2022 | 0 | 2 |
| 2023 | 0 | 0 |
| 2024 | 0 | 2 |
| 2025 | 3 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Particle monitoring system, particle monitoring method, and monitoring device23 Jun 2026US 12,663,350 B2Tokyo Electron Limited
- Method for in-situ U-Pb dating of heterogeneous minerals5 Aug 2025US 12,379,347 B2China University of Geosciences (Wuhan)
- Laser light source and photoelectron microscope17 Jun 2025US 12,332,196 B2Oxide Corporation
- Method and system for stress testing of materials using laser accelerated particles13 May 2025US 12,298,263 B2Institut National De La Recherche Scientifique
- Molecular imaging system21 Dec 1993US 5,272,338 AThe Pennsylvania Research Corporation
- Method for in-situ u-pb dating of heterogeneous minerals26 Sep 2024US 2024/0319137 A1China University of Geosciences (Wuhan)
- Particle monitoring system, particle monitoring method, and monitoring device29 Feb 2024US 2024/0068921 A1Tokyo Electron Limited
- Analysis device and analysis method3 Nov 2022US 2022/0349848 A1Keyence Corporation
- Laser light source and photoelectron microscope1 Sep 2022US 2022/0276187 A1Oxide Corporation
- Method and system for stress testing of materials14 Jan 2021US 2021/0010958 A1Institut National De La Recherche Scientifique
Most cited
By later US patents
- Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles36US 4,393,311 ABell Telephone Laboratories, Incorporated · 1983
- Thermal wave microscopy using areal infrared detection22US 4,578,584 AInternational Business Machines Corporation · 1986
- Molecular imaging system11US 5,272,338 AThe Pennsylvania Research Corporation · 1993