H01J 37/263
Contrast, resolution or power of penetration
Official title: {Contrast, resolution or power of penetration}
H01J37/263 (Contrast, resolution or power of penetration) appears on 212 US grants and 225 published applications in this corpus.
Search patents in H01J- Granted patents
- 212
- Published applications
- 225
- Assignees
- 90
- Inventors
- 482
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 1 | 1 |
| 2003 | 2 | 3 |
| 2004 | 1 | 1 |
| 2005 | 2 | 6 |
| 2006 | 1 | 4 |
| 2007 | 4 | 5 |
| 2008 | 11 | 10 |
| 2009 | 6 | 6 |
| 2010 | 8 | 13 |
| 2011 | 6 | 8 |
| 2012 | 8 | 5 |
| 2013 | 11 | 11 |
| 2014 | 19 | 25 |
| 2015 | 15 | 10 |
| 2016 | 13 | 15 |
| 2017 | 11 | 10 |
| 2018 | 11 | 8 |
| 2019 | 11 | 10 |
| 2020 | 11 | 8 |
| 2021 | 8 | 10 |
| 2022 | 4 | 10 |
| 2023 | 11 | 21 |
| 2024 | 10 | 12 |
| 2025 | 14 | 8 |
| 2026 | 7 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for inspection by deflector control in a charged particle system22 Sep 2026US 12,744,178 B2ASML Netherlands B. V.
- Laser-based contrast control in transmission electron microscopy15 Sep 2026US 12,738,449 B2Yeda Research and Development Co. Ltd.
- In situ biasing and freezing of cyrogenic electron microscopy samples1 Sep 2026US 12,723,955 B2Alliance for Energy Innovation, LLC
- Charged particle beam device and imaging method18 Aug 2026US 12,712,149 B2Hitachi High-Tech Corporation
- Transmission electron microscope in-situ chip and preparation method therefor28 Apr 2026US 12,614,694 B2Xiamen Chip-Nova Technology Co., Ltd.
- High-resolution low-distortion imaging using charged-particle scanning microscope30 Jul 2026US 2026/0221381 A1
- Off-plane imaging mode for a laser phase plate2 Jul 2026US 2026/0188611 A1FEI Company
- Standard sample for use in transmission electron microscope, method of preparing the same, method of adjusting transmission electron microscope, and method of analyzing observation image obtained with transmission electron microscope29 Jan 2026US 2026/0031300 A1Hitachi, Ltd.
- Adaptive dwell time microscopy15 Jan 2026US 2026/0018375 A1FEI Company
- Monitoring of imaging parameters of scanning electron microscopy18 Dec 2025US 2025/0385069 A1
Most cited
By later US patents
- Phase-contrast electron microscope and phase plate therefor34US 5,814,815 AHitachi, Ltd. · 1998
- Differential phase contrast scanning transmission electron microscope30US 5,004,918 AJEOL Ltd. · 1991
- Charge-control pre-scanning for e-beam imaging28US 7,253,410 B1KLA-Tencor Technologies Corporation · 2007
- Incoherent transmission electron microscopy27US 8,748,818 B2Mochii, Inc. · 2014
- Apparatus and method for e-beam dark imaging with perspective control25US 7,838,833 B1KLA-Tencor Technologies Corporation · 2010