Incoherent transmission electron microscopy
AssigneeMochii, Inc.
InventorsChristopher Su-Yan Own, Andrew Bleloch, William Andregg
Life of this patent
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Abstract
A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.
Claims15
A transmission electron microscope comprising:
- an electron beam source to generate an electron beam;
- beam optics to converge the electron beam;
- a specimen holder to hold a specimen in the path of the electron beam;
- and
- a detector to detect the electron beam transmitted through the specimen,
- wherein the transmission electron microscope is adapted to generate electron beams that are incoherent in relation to one another at different times to operate in an incoherent mode.
A transmission electron microscope comprising:
- an electron beam source to generate an electron beam;
- beam optics to converge the electron beam, the beam optics defining an optic axis of the microscope along which there is substantial cylindrical symmetry of the beam optics;
- a specimen holder to hold a specimen in the path of the electron beam;
- and
- a detector to detect the electron beam transmitted through the specimen,
- wherein the transmission electron microscope is adapted to generate electron beams that are incoherent in relation to one another at different times to operate in an incoherent mode.
A method of locating a sequence of objects on a molecule, the method comprising:
- generating electron beams that are incoherent in relation to one another at different times to operate the electron beams in an incoherent mode;
- converging the electron beams;
- holding a specimen in the path of the electron beams;
- and
- detecting the electron beams transmitted through the specimen to locate a sequence of objects on a molecule.
Dependencies are inferred from the claim text.