H01J 37/1475
Magnetic
Official title: {magnetic}
H01J37/1475 (Magnetic) appears on 153 US grants and 139 published applications in this corpus.
Search patents in H01J- Granted patents
- 153
- Published applications
- 139
- Assignees
- 95
- Inventors
- 364
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 1 | 0 |
| 1982 | 3 | 0 |
| 1983 | 3 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 3 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 5 | 0 |
| 1995 | 2 | 0 |
| 1996 | 4 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 1 |
| 2002 | 2 | 2 |
| 2003 | 2 | 1 |
| 2004 | 3 | 3 |
| 2005 | 2 | 2 |
| 2006 | 2 | 3 |
| 2007 | 0 | 2 |
| 2008 | 1 | 6 |
| 2009 | 4 | 1 |
| 2010 | 1 | 4 |
| 2011 | 3 | 1 |
| 2012 | 2 | 2 |
| 2013 | 2 | 5 |
| 2014 | 4 | 4 |
| 2015 | 8 | 8 |
| 2016 | 5 | 8 |
| 2017 | 6 | 4 |
| 2018 | 1 | 4 |
| 2019 | 11 | 16 |
| 2020 | 13 | 14 |
| 2021 | 16 | 8 |
| 2022 | 7 | 10 |
| 2023 | 4 | 10 |
| 2024 | 3 | 4 |
| 2025 | 12 | 13 |
| 2026 | 4 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Beam position displacement correction in charged particle inspection15 Sep 2026US 12,738,445 B2ASML Netherlands B. V.
- Detector substrate for use in a charged particle multi-beam assessment tool11 Aug 2026US 12,706,272 B2ASML Netherlands B. V.
- Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axis16 Jun 2026US 12,658,402 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Charged particle beam system and control method therefor24 Mar 2026US 12,586,750 B2JEOL Ltd.
- Compact 2D scanner magnet with double-helix coils30 Dec 2025US 12,512,292 B2Uchicago Argonne, LLC
- Multi-charged particle beam irradiation apparatus and multi-charged particle beam irradiation method23 Jul 2026US 2026/0213113 A1NuFlare Technology, Inc.
- Examining, analyzing and/or processing an object using an object receiving container12 Mar 2026US 2026/0074141 A1Carl Zeiss Microscopy GmbH
- Lens with a scanning system, charged particle beam apparatus, and method of scanning a charged particle beam15 Jan 2026US 2026/0018369 A1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Scanning deflector20 Nov 2025US 2025/0357071 A1
- Method for inspecting a specimen and charged particle beam device2 Oct 2025US 2025/0308835 A1APPLIED Materials.Inc.
Most cited
By later US patents
- System and method for magnetic scanning, accelerating, and implanting of an ion beam122US 5,483,077 ANissin Electric Co., Ltd. · 1996
- System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions89US 5,311,028 ANissin Electric Co., Ltd. · 1994
- Magnetic deflection system for ion beam implanters61US 5,393,984 ANissin Electric Co., Ltd. · 1995
- System for irradiating a surface with atomic and molecular ions using two dimensional magnetic scanning53US 5,132,544 ANissin Electric Co., Ltd. · 1992
- Manufacturing method for electrostatic deflector41US 6,125,522 ANikon Corporation · 2000