Compact 2D scanner magnet with double-helix coils

A system for scanning ion beams, the system comprising:

• an accelerator for accelerating an ion beam towards a two-dimensional (2D) target area;
• and
• a 2D scanning magnet configured to scan the ion beam across the 2D target area, the 2D scanning magnet comprising:
• an outer double-helix coil oriented along an axis comprising:
• a first outer coil that is configured to receive a first input electrical current flowing through the first outer coil along the axis in a first direction, and
• a second outer coil that is configured to receive the first input electrical current flowing through the second outer coil along the axis in a second direction that is different from the first direction, and
• an inner double-helix coil that is disposed within the outer double-helix coil and is rotated about the axis relative to the outer double-helix coil by an angle, the inner double-helix coil comprising:
• a first inner coil that is configured to receive a second input electrical current flowing through the first inner coil along the axis in the first direction, and
• a second inner coil that is configured to receive the second input electrical current flowing through the second inner coil along the axis in the second direction.

A method for scanning ion beams, the method comprising:

• directing an ion beam along an axis towards a 2D scanning magnet configured to scan the ion beam across a 2D target area, the 2D scanning magnet comprising:
• an outer double-helix coil oriented along an axis comprising:
• a first outer coil that is configured to receive a first input electrical current flowing through the first outer coil along the axis in a first direction, and
• a second outer coil that is configured to receive the first input electrical current flowing through the second outer coil along the axis in a second direction that is different from the first direction, and
• an inner double-helix coil that is disposed within the outer double-helix coil and is rotated about the axis relative to the outer double-helix coil by an angle, the inner double-helix coil comprising:
• a first inner coil that is configured to receive a second input electrical current flowing through the first inner coil along the axis in the first direction, and
• a second inner coil that is configured to receive the second input electrical current flowing through the second inner coil along the axis in the second direction;
• and
• scanning the ion beam across the 2D target area in a first direction and a second direction by sequentially adjusting a propagation direction of the ion beam with the 2D scanning magnet, wherein the first direction and the second direction are orthogonal to the axis.