H01J 2237/2805
Elastic scattering
H01J2237/2805 (Elastic scattering) appears on 19 US grants and 21 published applications in this corpus.
Search patents in H01J- Granted patents
- 19
- Published applications
- 21
- Assignees
- 19
- Inventors
- 68
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 1 | 2 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 2 | 0 |
| 2015 | 2 | 3 |
| 2016 | 1 | 1 |
| 2017 | 0 | 2 |
| 2018 | 2 | 2 |
| 2019 | 1 | 2 |
| 2020 | 5 | 3 |
| 2021 | 1 | 0 |
| 2022 | 1 | 0 |
| 2023 | 0 | 1 |
| 2024 | 1 | 1 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Detector and method for obtaining Kikuchi images14 Apr 2026US 12,603,246 B2Bruker Nano, Inc.
- Analysis method17 Sep 2024US 12,094,682 B2Kioxia Corporation
- Detection of buried features by backscattered particles13 Sep 2022US 11,443,915 B2ASML Netherlands B. V.
- Scanning electron microscope and method for determining crystal orientations2 Mar 2021US 10,935,505 B2JEOL Ltd.
- Electron microscope and specimen tilt angle adjustment method15 Dec 2020US 10,867,771 B2JEOL Ltd.
- Electron microscope detector and related methods24 Jul 2025US 2025/0239431 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Detector and method for obtaining kikuchi images8 Feb 2024US 2024/0047174 A1Bruker Nano, Inc.
- Analysis method12 Jan 2023US 2023/0010917 A1Kioxia Corporation
- Detection of buried features by backscattered particles30 Jul 2020US 2020/0243299 A1ASML Netherlands B. V.
- Enabling High Throughput Electron Channeling Contrast Imaging (ECCI) by Varying Electron Beam Energy23 Jan 2020US 2020/0027690 A1International Business Machines Corporation
Most cited
By later US patents
- Scanning transmission electron microscopes18US 4,514,629 ANational Research Development Corporation · 1985
- Scanning electron microscope6US 9,040,911 B2Hitachi High-Technologies Corporation · 2015
- Specimen observation method and device using secondary emission electron and mirror electron detection3US 8,937,283 B2Ebara Corporation · 2015
- Transmission electron microscope sample alignment system and method2US 10,067,078 B1King Abdullah University of Science and Technology · 2018
- 3D defect characterization of crystalline samples in a scanning type electron microscope2US 10,784,076 B2FEI Company · 2020