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H01J 2237/2623

Field-emission microscopes

H01J2237/2623 (Field-emission microscopes) appears on 38 US grants and 38 published applications in this corpus.

Search patents in H01J

Granted patents: 38
Published applications: 38
Assignees: 25
Inventors: 82
Latest grant: 5 May 2026

Filings by year

H01J 2237/2623: granted patents and published applications per publication year
Year	Granted patents	Published applications
2007	0	17
2008	1	0
2009	14	2
2010	1	0
2011	0	0
2012	1	1
2013	0	0
2014	2	2
2015	2	3
2016	4	1
2017	0	1
2018	2	3
2019	0	1
2020	4	1
2021	0	2
2022	1	2
2023	2	2
2024	1	0
2025	2	0
2026	1	0

By publication year. 2026 runs to 8 Oct.

Subgroups

Granted patents

H01J 2237/2626Pulsed sourceIndexing code15

Recent patents

Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
Surface analysis system comprising a pulsed electron source12 Aug 2025US 12,387,901 B2Centre National De La Recherche Scientifique
Electron gun and electron beam application device17 Jun 2025US 12,334,297 B2Hitachi High-Tech Corporation
Adjusting method of charged particle beam device and charged particle beam device system4 Jun 2024US 12,001,521 B2Hitachi High-Tech Corporation
Stimulated or non-equilibrium energy-loss and energy-gain spectroscopy device28 Nov 2023US 11,830,718 B2Centre National De La Recherche Scientifique

Most cited

By later US patents