H01J 2237/2626
Pulsed source
H01J2237/2626 (Pulsed source) appears on 15 US grants and 15 published applications in this corpus.
Search patents in H01J- Granted patents
- 15
- Published applications
- 15
- Assignees
- 15
- Inventors
- 54
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 2 |
| 2016 | 3 | 1 |
| 2017 | 0 | 1 |
| 2018 | 2 | 3 |
| 2019 | 0 | 0 |
| 2020 | 3 | 1 |
| 2021 | 0 | 2 |
| 2022 | 1 | 2 |
| 2023 | 2 | 2 |
| 2024 | 1 | 0 |
| 2025 | 2 | 0 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Surface analysis system comprising a pulsed electron source12 Aug 2025US 12,387,901 B2Centre National De La Recherche Scientifique
- Electron gun and electron beam application device17 Jun 2025US 12,334,297 B2Hitachi High-Tech Corporation
- Adjusting method of charged particle beam device and charged particle beam device system4 Jun 2024US 12,001,521 B2Hitachi High-Tech Corporation
- Stimulated or non-equilibrium energy-loss and energy-gain spectroscopy device28 Nov 2023US 11,830,718 B2Centre National De La Recherche Scientifique
- Electron gun and electron beam application device14 Dec 2023US 2023/0402246 A1Hitachi High-Tech Corporation
- Surface analysis system comprising a pulsed electron source1 Jun 2023US 2023/0170176 A1Centre National De La Recherche Scientifique
- Tomographic atom probe with terahertz pulse generator11 Aug 2022US 2022/0254601 A1Centre National De La Recherche Scientifique
- Automated tomography field ion microscope5 May 2022US 2022/0139666 A1Centre National De La Recherche Scientifique
- System and method for performing three-dimensional compositional analyses18 Nov 2021US 2021/0356429 A1GLOBALFOUNDRIES U. S. Inc.
Most cited
By later US patents
- Device and method for electron emission and device including such an electron emission system7US 9,263,229 B2Centre National de la Recherche Scientifique (CNRS) · 2016
- Time-of-flight charged particle spectroscopy5US 9,984,852 B1FEI Company · 2018
- Methods for stabilizing biological and soft materials for atom probe tomography2US 10,684,308 B12020
- Electron beam generation for transmission electron microscope1US 10,529,536 B2Technische Universiteit Eindhoven · 2020
- Stimulated or non-equilibrium energy-loss and energy-gain spectroscopy device1US 11,830,718 B2Centre National De La Recherche Scientifique · 2023