Time-of-flight charged particle spectroscopy
AssigneeFEI Company
InventorsOtger Jan Luiten, Petrus Henricus Antonius Mutsaers, Jasper Frans Mathijs van Rens, Wouter Verhoeven, Erik René Kieft
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AssigneeFEI Company
InventorsOtger Jan Luiten, Petrus Henricus Antonius Mutsaers, Jasper Frans Mathijs van Rens, Wouter Verhoeven, Erik René Kieft
Estimating the term…
An apparatus for performing charged particle spectroscopy, comprising: A source, for producing a pulsed beam of charged particles that propagate along a beam path; A specimen holder, for holding a specimen at an irradiation position in said beam path; A detector arrangement, for performing energy-differentiated detection of charged particles that traverse said specimen, wherein, between said source and said detector arrangement, said beam path successively traverses: An energizing cavity, for applying a time-dependent accelerating field to said beam; A primary drift space; Said irradiation position; A temporal focusing cavity, for converting an energy differential in said beam into a time-of-flight differential; A secondary drift space.
An apparatus for performing charged particle spectroscopy, comprising:
A method of performing charged particle spectroscopy, comprising:
Dependencies are inferred from the claim text.