H01J 2237/262
Non-scanning techniques
H01J2237/262 (Non-scanning techniques) appears on 97 US grants and 95 published applications in this corpus.
Search patents in H01J- Granted patents
- 97
- Published applications
- 95
- Assignees
- 64
- Inventors
- 212
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 2 |
| 2003 | 1 | 3 |
| 2004 | 4 | 2 |
| 2005 | 2 | 1 |
| 2006 | 4 | 7 |
| 2007 | 4 | 23 |
| 2008 | 7 | 1 |
| 2009 | 15 | 7 |
| 2010 | 5 | 1 |
| 2011 | 2 | 2 |
| 2012 | 2 | 4 |
| 2013 | 5 | 2 |
| 2014 | 6 | 4 |
| 2015 | 2 | 5 |
| 2016 | 5 | 2 |
| 2017 | 2 | 6 |
| 2018 | 6 | 7 |
| 2019 | 4 | 3 |
| 2020 | 9 | 2 |
| 2021 | 0 | 4 |
| 2022 | 2 | 2 |
| 2023 | 4 | 4 |
| 2024 | 1 | 1 |
| 2025 | 2 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Surface analysis system comprising a pulsed electron source12 Aug 2025US 12,387,901 B2Centre National De La Recherche Scientifique
- Electron gun and electron beam application device17 Jun 2025US 12,334,297 B2Hitachi High-Tech Corporation
- Adjusting method of charged particle beam device and charged particle beam device system4 Jun 2024US 12,001,521 B2Hitachi High-Tech Corporation
- Grid structure28 Nov 2023US 11,830,702 B2Changxin Memory Technologies, Inc.
- Fiber Fabry-Perot Cavity Laser Phase Plate For Charged Particle Microscopy4 Jul 2024US 2024/0222066 A1FEI Company
- Electron gun and electron beam application device14 Dec 2023US 2023/0402246 A1Hitachi High-Tech Corporation
- Surface analysis system comprising a pulsed electron source1 Jun 2023US 2023/0170176 A1Centre National De La Recherche Scientifique
- Grid structure23 Feb 2023US 2023/0059669 A1Changxin Memory Technologies, Inc.
- Electron source based on field emission and production process for same5 Jan 2023US 2023/0005695 A1Centre National De La Recherche Scientifique
Most cited
By later US patents
- Ion sources, systems and methods93US 7,554,096 B2ALIS Corporation · 2009
- Ion sources, systems and methods67US 7,554,097 B2ALIS Corporation · 2009
- Ion sources, systems and methods65US 7,557,359 B2ALIS Corporation · 2009
- Ion sources, systems and methods64US 7,557,358 B2ALIS Corporation · 2009
- Ion sources, systems and methods63US 7,557,360 B2ALIS Corporation · 2009