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AssigneesCentre National De La Recherche Scientifique, Institut National Des Sciences Appliquees De Rouen, Universite De Rouen Normandie
InventorsAngela VELLA, Jonathan HOUARD, Ammar HIDEUR, Laurent ARNOLDI, Lorenzo RIGUTTI
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A tomographic atom probe includes an analysis chamber intended to analyze a sample of material in the form of a nanotip mounted on an anti-vibration support, the nanotip being brought to a temperature of between 0 kelvin and ambient temperature, the nanotip being biased at an adjustable voltage of between 1 kV and 15 kV, the analysis chamber comprising a position-sensitive and time of flight-sensitive ion detector. The atom probe comprises a generator for generating high-peak-intensity single-cycle ultrashort terahertz pulses, the analysis chamber comprising optical means for focusing the terahertz pulses, the focusing of the terahertz pulses causing the atoms of the nanotip to evaporate through the field effect without thermal effects. The terahertz pulses are generated by a femtosecond pulsed laser emitting very high-power ultrashort optical pulses at a high rate.
A tomographic atom probe comprising an analysis chamber operating at ambient temperature, said analysis chamber being intended to analyze a sample (E) of material in the form of a nanotip mounted on an anti-vibration support, said nanotip being brought to a temperature of between 0 kelvin and ambient temperature by a cryogenic device said nanotip being biased at an adjustable voltage of between 1 kV and 15 kV by an electronic device, said analysis chamber comprising a position-sensitive and time of flight-sensitive ion detector, wherein said atom probe comprises a generator for generating high-peak-intensity single-cycle ultrashort terahertz pulses, the analysis chamber comprising optical means for focusing said terahertz pulses, the focusing of the terahertz pulses causing the atoms of the nanotip to evaporate through the field effect without thermal effects.
Dependencies are inferred from the claim text.