H01J 2237/24425
Wavelength-dispersive spectrometer
H01J2237/24425 (Wavelength-dispersive spectrometer) appears on 15 US grants and 11 published applications in this corpus.
Search patents in H01J- Granted patents
- 15
- Published applications
- 11
- Assignees
- 7
- Inventors
- 22
- Latest grant
- 11 Jul 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 1 | 2 |
| 2009 | 3 | 0 |
| 2010 | 0 | 1 |
| 2011 | 2 | 0 |
| 2012 | 0 | 1 |
| 2013 | 1 | 0 |
| 2014 | 0 | 1 |
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 0 |
| 2019 | 1 | 1 |
| 2020 | 1 | 2 |
| 2021 | 0 | 0 |
| 2022 | 1 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- X-ray detection apparatus and method11 Jul 2023US 11,699,567 B2JEOL Ltd.
- Analysis device and spectrum generation method7 Jun 2022US 11,353,414 B2JEOL Ltd.
- X-ray analyzer and method for correcting counting rate18 Aug 2020US 10,748,741 B2JEOL Ltd.
- Electron probe microanalyzer and storage medium10 Sep 2019US 10,410,825 B2Shimadzu Corporation
- Automated mineral classification3 Oct 2017US 9,778,215 B2FEI Company
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- X-Ray Detection Apparatus and Method2 Jun 2022US 2022/0172923 A1JEOL Ltd.
- Analysis Device and Spectrum Generation Method10 Sep 2020US 2020/0284739 A1JEOL Ltd.
- X-Ray Analyzer and Method for Correcting Counting Rate20 Feb 2020US 2020/0058464 A1JEOL Ltd.
- Electron probe microanalyzer and storage medium3 Jan 2019US 2019/0006146 A1Shimadzu Corporation
Most cited
By later US patents
- Wavelength-dispersive X-ray spectrometer45US 7,864,922 B2JEOL Ltd. · 2011
- X-ray detection system for wavelength dispersive and energy dispersive spectroscopy and electron beam applications32US 7,928,400 B1Bruker AXS GmbH · 2011
- Electron probe microanalyzer and X-ray analysis using same16US 5,656,812 AJEOL Ltd. · 1997
- X-ray metrology with diffractors11US 7,519,153 B1KLA-Tencor Technologies Corporation · 2009
- X-ray analysis apparatus provided with a double collimator mask8US 5,898,752 AU. S. Philips Corporation · 1999