Electron probe microanalyzer and storage medium
AssigneeShimadzu Corporation
InventorHiroshi Sakamae
Life of this patent
Estimating the term…
Loading patent…
AssigneeShimadzu Corporation
InventorHiroshi Sakamae
Estimating the term…
An EDS 5 acquires first spectrum data by detecting an X-ray generated from a sample. A WDS 6 acquires second spectrum data by detecting the X-ray generated from the sample. A phase distribution map generation processing unit 11 generates a phase distribution map of a substance of the sample in a measurement region, on the basis of the first spectrum data acquired with respect to each pixel in the measurement region on a sample surface. A composition information acquisition processing unit 13 acquires element composition information of each phase, on the basis of the second spectrum data acquired with respect to a position on the sample corresponding to a representative pixel in the measurement region corresponding to each of the phases of the phase distribution map.
An electron probe microanalyzer, comprising:
A storage medium storing a data processing program used for an electron probe microanalyzer, which includes an electron probe irradiation unit generating an X-ray by irradiating a sample with an electron probe, an energy dispersive X-ray spectrometer acquiring first spectrum data by detecting the X-ray generated from the sample, and a wavelength dispersive X-ray spectrometer acquiring second spectrum data by detecting the X-ray generated from the sample, the medium allowing a computer to function as:
Dependencies are inferred from the claim text.