H01J 2237/24415
X-ray
H01J2237/24415 (X-ray) appears on 132 US grants and 113 published applications in this corpus.
Search patents in H01J- Granted patents
- 132
- Published applications
- 113
- Assignees
- 58
- Inventors
- 242
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 4 | 0 |
| 1997 | 2 | 0 |
| 1998 | 4 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 1 |
| 2003 | 1 | 0 |
| 2004 | 2 | 0 |
| 2005 | 0 | 1 |
| 2006 | 3 | 4 |
| 2007 | 4 | 2 |
| 2008 | 3 | 3 |
| 2009 | 3 | 1 |
| 2010 | 0 | 5 |
| 2011 | 5 | 5 |
| 2012 | 3 | 8 |
| 2013 | 8 | 5 |
| 2014 | 7 | 10 |
| 2015 | 8 | 9 |
| 2016 | 6 | 7 |
| 2017 | 13 | 6 |
| 2018 | 6 | 6 |
| 2019 | 5 | 6 |
| 2020 | 5 | 10 |
| 2021 | 7 | 4 |
| 2022 | 6 | 7 |
| 2023 | 4 | 4 |
| 2024 | 3 | 2 |
| 2025 | 2 | 5 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Shielded detector for charged particle microscopy19 May 2026US 12,633,496 B2FEI Company
- Material analysis with multiple detectors21 Apr 2026US 12,607,581 B2Oxford Instruments Nanotechnology Tools Limited
- Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification16 Sep 2025US 12,417,645 B2FEI Company
- Method for operating a particle beam microscope, particle beam microscope and computer program product24 Jun 2025US 12,340,972 B2Carl Zeiss Microscopy GmbH
- High resolution light valve detector for detecting x-ray29 Oct 2024US 12,130,392 B2Carl Zeiss X-ray Microscopy, Inc.
- Analyzer and Analysis Method27 Aug 2026US 2026/0251596 A1JEOL Ltd.
- Notch filter for high throughput x-ray photon spectroscopy19 Mar 2026US 2026/0081103 A1Applied Materials Israel Ltd.
- Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification25 Dec 2025US 2025/0391182 A1FEI Company
- Classifying microscopic components of physical samples6 Nov 2025US 2025/0342704 A1FEI Company
- A multi-mode low-voltage electron microscope10 Jul 2025US 2025/0226173 A1Delong Instruments A.S.
Most cited
By later US patents
- Method of multivariate spectral analysis138US 6,675,106 B1Sandia Corporation · 2004
- Surface analysis method and apparatus for carrying out the same72US 5,481,109 AHitachi, Ltd. · 1996
- Film thickness measurement using electron-beam induced x-ray microanalysis66US 6,787,773 B1KLA-Tencor Corporation · 2004
- Method and system for tomographic projection correction52US 8,353,628 B1Xradia, Inc. · 2013
- Method for automatically establishing a wafer coordinate system51US 5,497,007 AAPPLIED Materials.Inc. · 1996