H01J 2237/2442
Energy-dispersive spectrometer
Official title: Energy-dispersive (Si-Li type) spectrometer
H01J2237/2442 (Energy-dispersive spectrometer) appears on 76 US grants and 64 published applications in this corpus.
Search patents in H01J- Granted patents
- 76
- Published applications
- 64
- Assignees
- 44
- Inventors
- 168
- Latest grant
- 19 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 0 | 0 |
| 1998 | 4 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 1 |
| 2010 | 0 | 2 |
| 2011 | 3 | 3 |
| 2012 | 2 | 5 |
| 2013 | 5 | 2 |
| 2014 | 3 | 6 |
| 2015 | 3 | 6 |
| 2016 | 2 | 4 |
| 2017 | 10 | 4 |
| 2018 | 5 | 5 |
| 2019 | 3 | 5 |
| 2020 | 4 | 8 |
| 2021 | 5 | 0 |
| 2022 | 5 | 3 |
| 2023 | 0 | 2 |
| 2024 | 2 | 2 |
| 2025 | 0 | 3 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Shielded detector for charged particle microscopy19 May 2026US 12,633,496 B2FEI Company
- Material analysis with multiple detectors21 Apr 2026US 12,607,581 B2Oxford Instruments Nanotechnology Tools Limited
- Semiconductor device17 Sep 2024US 12,094,980 B2Japan Display Inc.
- Radiation analysis system, charged particle beam system, and radiation analysis method3 Sep 2024US 12,078,763 B2Hitachi High-Tech Corporation
- SNR for x-ray detectors in SEM systems by using polarization filter13 Dec 2022US 11,525,791 B1Applied Materials Israel Ltd.
- Notch filter for high throughput x-ray photon spectroscopy19 Mar 2026US 2026/0081103 A1Applied Materials Israel Ltd.
- Classifying microscopic components of physical samples6 Nov 2025US 2025/0342704 A1FEI Company
- A multi-mode low-voltage electron microscope10 Jul 2025US 2025/0226173 A1Delong Instruments A.S.
- Shielded detector for charged particle microscopy27 Feb 2025US 2025/0069844 A1FEI Company
- Array substrate26 Dec 2024US 2024/0429320 A1Japan Display Inc.
Most cited
By later US patents
- Method of multivariate spectral analysis138US 6,675,106 B1Sandia Corporation · 2004
- Method for automatically establishing a wafer coordinate system51US 5,497,007 AAPPLIED Materials.Inc. · 1996
- Closed cycle gas cryogenically cooled radiation detector49US 5,552,608 APhilips Electronics North America Corporation · 1996
- Closed cycle gas cryogenically cooled radiation detector44US 5,811,816 AU. S. Philips Corporation · 1998
- Light element measurement39US 7,006,596 B1KLA-Tencor Technologies Corporation · 2006