US 7,006,596 B1 · Light element measurement

Abstract

A spectrometer for detecting and quantifying elements in a sample. An exciter ionizes atoms in the sample, and the atoms thereby produce characteristic x-rays. A detector receives the x-rays and produces signals based on the x-rays. A filter system selectively blocks the x-rays from attaining the detector. The selective blocking of the x-rays is accomplished based on an energy of the x-rays. An analyzer receives the signals from the detector and detects and quantifies the elements in the sample based at least in part on the signals. In this manner, detector receives the light element x-rays, and the medium and heavy element x-rays are filtered out to avoid overwhelming the detector. This invention combines the large solid angle, high efficiency, and ability to measure the continuous background spectrum of the energy dispersive x-ray detector with the selectivity of the wavelength dispersive x-ray detector. It thus enables faster and more accurate measurement of light elements in thin films. This invention enhances the light element performance of a system by enabling higher throughput, lower e-beam and x-ray dose to the sample, and improved accuracy from the capability to measure the background radiation.

Claims16

Dependent claims

A spectrometer for detecting and quantifying elements in a sample, the spectrometer comprising:

an exciter adapted to ionize atoms in the sample, the atoms thereby producing x-rays,
a detector adapted to receive the x-rays and produce signals based on the x-rays,
a filter system adapted to selectively block the x-rays from attaining the detector,
where the selective blocking of the x-rays is accomplished based on an energy of the x-rays, the filter system including,
a parabolic collimator having a smooth metallic surface disposed around the sample and adapted to collect the x-rays emitted from the sample, where the collimator absorbs x-rays having an energy greater than a first desired energy, and directs x-rays having an energy less than the first desired energy along a collimated beam, and
a reflector adapted to receive the collimated beam from the collimator at an angle of incidence that is below a critical angle for energies of the x-rays in the collimated beam that are below a desired cutoff energy of about five hundred electron volts, thereby reflecting x-rays in the collimated beam with an energy less than the desired cutoff energy and absorbing x-rays in the collimated beam with an energy greater than the desired cutoff energy, and
an analyzer adapted to receive the signals from the detector and to detect and quantify the elements in the sample based at least in part on the signals.

4 more elements

In a scanning electron microscope of the type having an electron beam that ionizes atoms in a sample, the atoms thereby producing x-rays, the improvement comprising:

a detector adapted to receive the x-rays and produce signals based on the x-rays,
a filter system adapted to selectively block the x-rays from attaining the detector, where the selective blocking of the x-rays is accomplished based on an energy of the x-rays, the filter system including,
a parabolic collimator having a smooth metallic surface disposed around the sample and adapted to collect the x-rays emitted from the sample, where the collimator absorbs x-rays having an energy greater than a first desired energy, and directs x-rays having an energy less than the first desired energy along a collimated beam, and
a reflector adapted to receive the collimated beam from the collimator at an angle of incidence that is below a critical angle for energies of the x-rays in the collimated beam that are below a desired cutoff energy of about five hundred electron volts, thereby reflecting x-rays in the collimated beam with an energy less than the desired cutoff energy and absorbing x-rays in the collimated beam with an energy greater than the desired cutoff energy, and
an analyzer adapted to receive the signals from the detector and to detect and quantify elements in the sample based at least in part on the signals.

2 more elements

Dependencies are inferred from the claim text.

Light element measurement

Life of this patent

Light element measurement

Life of this patent

Abstract

Claims16