G01R 31/318594
Timing aspects
Official title: {Timing aspects (clock circuits G01R31/318552)}
G01R31/318594 (Timing aspects) appears on 510 US grants and 486 published applications in this corpus.
Search patents in G01R- Granted patents
- 510
- Published applications
- 486
- Assignees
- 138
- Inventors
- 729
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 5 | 0 |
| 2001 | 17 | 7 |
| 2002 | 15 | 18 |
| 2003 | 9 | 14 |
| 2004 | 16 | 27 |
| 2005 | 24 | 31 |
| 2006 | 19 | 22 |
| 2007 | 27 | 33 |
| 2008 | 27 | 37 |
| 2009 | 33 | 27 |
| 2010 | 42 | 23 |
| 2011 | 24 | 24 |
| 2012 | 23 | 23 |
| 2013 | 26 | 22 |
| 2014 | 26 | 21 |
| 2015 | 15 | 21 |
| 2016 | 25 | 19 |
| 2017 | 21 | 12 |
| 2018 | 16 | 12 |
| 2019 | 11 | 14 |
| 2020 | 11 | 11 |
| 2021 | 11 | 9 |
| 2022 | 10 | 7 |
| 2023 | 16 | 16 |
| 2024 | 9 | 15 |
| 2025 | 16 | 16 |
| 2026 | 7 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for controlling at-speed testing of integrated circuits25 Aug 2026US 12,716,942 B2NXP B. V.
- Low power multibit flip-flop for standard cell library19 May 2026US 12,633,905 B2Samsung Electronics Co., Ltd.
- Diagnosing identical circuit blocks in data streaming environment7 Apr 2026US 12,596,149 B2Siemens Industry Software Inc.
- Clock insertion delay systems and methods7 Apr 2026US 12,597,931 B2Lattice Semiconductor Corporation
- Test for source synchronous interfaces17 Feb 2026US 12,553,942 B2NXP B. V.
- Circuitry for Staggering Capture Clocks in Testing Electronic Circuits with Multiple Clock Domains6 Aug 2026US 2026/0227442 A1Synopsys, Inc.
- Voltage droop mitigation during automotive electronics built in self test28 May 2026US 2026/0147039 A1QUALCOMM Incorporated
- Clock control circuit and method16 Apr 2026US 2026/0104455 A1Realtek Semiconductor Corp.
- Logic bist circuit and semiconductor device including same29 Jan 2026US 2026/0029466 A1Samsung Electronics Co., Ltd.
- Reset test system and system-on-chip including the same8 Jan 2026US 2026/0009848 A1Itda Semiconductor Co., Ltd.
Most cited
By later US patents
- Apparatus for at-speed testing, in inter-domain mode, of a multi-clock-domain digital integrated circuit according to BIST or SCAN techniques226US 8,862,955 B2STMicroelectronics S,r.l. · 2014
- Efficient fir filter for high-speed communication118US 6,272,173 B1Broadcom Corporation · 2001
- Method and apparatus for testing circuits with multiple clocks117US 6,442,722 B1LogicVision, Inc. · 2002
- Pair-swap independent trellis decoder for a multi-pair gigabit transceiver95US 6,865,234 B1Broadcom Corporation · 2005
- Demodulator for a multi-pair gigabit transceiver83US 6,201,831 B1Broadcom Corporation · 2001