G01R 31/318586
With partial scan or non-scannable parts
Official title: {with partial scan or non-scannable parts}
G01R31/318586 (With partial scan or non-scannable parts) appears on 125 US grants and 64 published applications in this corpus.
Search patents in G01R- Granted patents
- 125
- Published applications
- 64
- Assignees
- 57
- Inventors
- 204
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 6 | 0 |
| 1996 | 11 | 0 |
| 1997 | 9 | 0 |
| 1998 | 12 | 0 |
| 1999 | 3 | 0 |
| 2000 | 5 | 0 |
| 2001 | 10 | 3 |
| 2002 | 4 | 4 |
| 2003 | 5 | 2 |
| 2004 | 3 | 7 |
| 2005 | 2 | 3 |
| 2006 | 6 | 5 |
| 2007 | 3 | 0 |
| 2008 | 5 | 2 |
| 2009 | 4 | 4 |
| 2010 | 2 | 2 |
| 2011 | 3 | 2 |
| 2012 | 3 | 4 |
| 2013 | 4 | 5 |
| 2014 | 2 | 4 |
| 2015 | 3 | 2 |
| 2016 | 0 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 0 |
| 2019 | 2 | 2 |
| 2020 | 0 | 1 |
| 2021 | 2 | 3 |
| 2022 | 2 | 1 |
| 2023 | 1 | 1 |
| 2024 | 1 | 3 |
| 2025 | 2 | 3 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Integrated circuit with multiplexer for testing16 Jun 2026US 12,656,397 B2Samsung Electronics Co., Ltd.
- Methods and apparatus to identify faults in processors12 May 2026US 12,625,179 B2Texas Instruments Incorporated
- Circuitry including scan and non-scan registers14 Apr 2026US 12,601,784 B2Arm Limited
- Test pattern reset control circuit9 Dec 2025US 12,493,075 B1STMicroelectronics International N. V.
- Scan circuit and method15 Jul 2025US 12,360,161 B2STMicroelectronics International N. V.
- Test pattern reset control circuit11 Dec 2025US 2025/0377409 A1STMicroelectronics International N. V.
- Circuitry including scan and non-scan registers2 Oct 2025US 2025/0306098 A1Arm Limited
- Integrated circuit with multiplexer for testing23 Jan 2025US 2025/0027992 A1Samsung Electronics Co., Ltd.
- Methods and apparatus to identify faults in processors17 Oct 2024US 2024/0345160 A1Texas Instruments Incorporated
- Techniques For Storing States Of Signals In Configurable Storage Circuits25 Apr 2024US 2024/0137026 A1Altera Corporation
Most cited
By later US patents
- JTAG interface system for communicating with compliant and non-compliant JTAG devices110US 5,708,773 AUnisys Corporation · 1998
- Constraint driven insertion of scan logic for implementing design for test within an integrated circuit design98US 5,903,466 ASynopsys, Inc. · 1999
- Partial-scan built-in self-testing circuit having improved testability72US 5,450,414 AAT&T Corp. · 1995
- Method and apparatus for performing partial unscan and near full scan within design for test applications72US 5,696,771 ASynopsys, Inc. · 1997
- Method and integrated circuit adapted for partial scan testability65US 5,043,986 AAT&T Bell Laboratories · 1991