G01R 31/318392
For sequential circuits
Official title: {for sequential circuits (G01R31/318544 takes precedence)}
G01R31/318392 (For sequential circuits) appears on 65 US grants and 20 published applications in this corpus.
Search patents in G01R- Granted patents
- 65
- Published applications
- 20
- Assignees
- 43
- Inventors
- 125
- Latest grant
- 17 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 4 | 0 |
| 1994 | 2 | 0 |
| 1995 | 11 | 0 |
| 1996 | 6 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 5 | 0 |
| 2000 | 2 | 0 |
| 2001 | 4 | 0 |
| 2002 | 4 | 4 |
| 2003 | 1 | 1 |
| 2004 | 2 | 1 |
| 2005 | 2 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 1 |
| 2008 | 0 | 0 |
| 2009 | 1 | 1 |
| 2010 | 0 | 2 |
| 2011 | 2 | 0 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 2 |
| 2018 | 3 | 2 |
| 2019 | 1 | 0 |
| 2020 | 1 | 0 |
| 2021 | 1 | 1 |
| 2022 | 0 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
| 2026 | 1 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Scan chain control17 Mar 2026US 12,578,386 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Trajectory-optimized test pattern generation for built-in self-test21 Feb 2023US 11,585,853 B2Siemens Industry Software Inc.
- One-shot circuit4 May 2021US 10,996,272 B2Teradyne, Inc.
- Method and device for testing a chain of flip-flops16 Jun 2020US 10,684,326 B2STMicroelectronics (Crolles 2) SAS
- Sequential circuit, scan chain circuit including the same and integrated circuit including the same24 Sep 2019US 10,422,832 B2Samsung Electronics Co., Ltd.
- Scan chain control2 Jul 2026US 2026/0186056 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Device and Method for Diagnosis of the Same25 Jun 2026US 2026/0177614 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method and apparatus for determining settling of analog signal in semiconductor device testing2 Apr 2026US 2026/0092971 A1Xcerra Corporation
- Scan chain control18 Sep 2025US 2025/0290981 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Trajectory-Optimized Test Pattern Generation for Built-In Self-Test27 May 2021US 2021/0156918 A1Mentor Graphics Corporation
Most cited
By later US patents
- Method and apparatus for verifying asynchronous circuits using static timing analysis and dynamic functional simulation55US 5,650,938 ASynopsys, Inc. · 1997
- Method and apparatus for estimating fault coverage45US 4,937,765 AMentor Graphics Corporation · 1990
- Logic network test system with simulator oriented fault test generator41US 3,961,250 AInternational Business Machines Corporation · 1976
- Method and apparatus for generating test pattern for sequential logic circuit of integrated circuit33US 5,430,736 AMatsushita Electric Industrial Co., Ltd. · 1995
- Phase lock loop with self test circuitry and method for using the same31US 5,381,085 AMotorola, Inc. · 1995