Trajectory-Optimized Test Pattern Generation for Built-In Self-Test

One or more computer-readable media storing computer-executable instructions for causing a computer to perform a method, the method comprising:

• creating a circuit in a circuit design for testing a chip fabricated according to the circuit design, the circuit comprising:
• a bit-flipping signal generation device comprising a storage device and configured to generate a bit-flipping signal based on bit-flipping location information, the storage device configured to store the bit-flipping location information for a first number of bits, the bit-flipping location information obtained through a fault simulation process;
• a pseudo random test pattern generator configured to generate test patterns based on the bit-flipping signal, the pseudo random test pattern generator comprising a register configured to be a linear finite state machine, the register comprising storage elements and bit-flipping devices, each of the bit-flipping devices coupled to one of the storage elements;
• and
• scan chains configured to receive the test patterns,
• wherein the bit-flipping signal causes one of the bit-flipping devices to invert a bit of the register each time a second number of test patterns is being generated by the pseudo random test pattern generator during a test.