G01R 1/07392
Manipulating each probe element or tip individually
Official title: {manipulating each probe element or tip individually}
G01R1/07392 (Manipulating each probe element or tip individually) appears on 99 US grants and 72 published applications in this corpus.
Search patents in G01R- Granted patents
- 99
- Published applications
- 72
- Assignees
- 55
- Inventors
- 177
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 2 | 0 |
| 1979 | 1 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 3 | 0 |
| 1989 | 3 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 1 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 3 | 2 |
| 2002 | 2 | 1 |
| 2003 | 0 | 2 |
| 2004 | 2 | 4 |
| 2005 | 5 | 9 |
| 2006 | 3 | 1 |
| 2007 | 3 | 3 |
| 2008 | 3 | 1 |
| 2009 | 2 | 1 |
| 2010 | 1 | 1 |
| 2011 | 2 | 2 |
| 2012 | 1 | 2 |
| 2013 | 2 | 1 |
| 2014 | 2 | 0 |
| 2015 | 0 | 4 |
| 2016 | 2 | 0 |
| 2017 | 3 | 2 |
| 2018 | 3 | 4 |
| 2019 | 3 | 6 |
| 2020 | 6 | 6 |
| 2021 | 4 | 3 |
| 2022 | 3 | 3 |
| 2023 | 5 | 1 |
| 2024 | 2 | 4 |
| 2025 | 1 | 4 |
| 2026 | 4 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Positioning method and probe system for performing the same, method for operating probe system, and method for utilizing probe system to produce a tested semiconductor device1 Sep 2026US 12,724,042 B2Mpi Corporation
- Voice coil leaf spring prober23 Jun 2026US 12,663,466 B2MACOM Technology Solutions Holdings, Inc.
- Test needle, test probe, and flying probe tester for testing printed circuit boards9 Jun 2026US 12,650,464 B2Atg Mycronic GmbH
- Automatic board probing station12 May 2026US 12,625,177 B2NVIDIA Corporation
- Test head for a finger tester, and method for testing printed circuit boards19 Aug 2025US 12,392,800 B2Atg Luther & Maelzer GmbH
- Method of and sensing probe device for measuring a parameter of a quantum chip17 Sep 2026US 2026/0276675 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- High-voltage surge testing14 May 2026US 2026/0133223 A1
- Reconfigurable probe card for cryogenic applications26 Mar 2026US 2026/0086121 A1International Business Machines Corporation
- Supporting structure of membrane probe card and test method of membrane probe card5 Mar 2026US 2026/0063670 A1Xingr Technologies (Zhejiang) Limited
- Test contact, table device, test contact holding device, and method for receiving a test contact in a simplified manner with an active pre-alignment process using electromagnetic manipulation5 Feb 2026US 2026/0036607 A1Pac Tech - Packaging Technology GmbH
Most cited
By later US patents
- Microprobe240US 5,475,318 ARoxburgh Ltd. · 1995
- Method of producing micro contact structure and contact probe using same142US 6,174,744 B1Advantest Corporation · 2001
- Bumped semiconductor device and method for probing the same131US 5,554,940 AMotorola, Inc. · 1996
- High resolution analytical probe station130US 6,744,268 B2The Micromanipulator Company, Inc. · 2004
- Wafer probe station having full guarding126US 5,457,398 ACascade Microtech, Inc. · 1995