G01R 1/0735
Arranged on a flexible frame or film
Official title: {arranged on a flexible frame or film}
G01R1/0735 (Arranged on a flexible frame or film) appears on 445 US grants and 410 published applications in this corpus.
Search patents in G01R- Granted patents
- 445
- Published applications
- 410
- Assignees
- 174
- Inventors
- 671
- Latest grant
- 14 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 3 | 0 |
| 1988 | 0 | 0 |
| 1989 | 5 | 0 |
| 1990 | 10 | 0 |
| 1991 | 7 | 0 |
| 1992 | 9 | 0 |
| 1993 | 9 | 0 |
| 1994 | 9 | 0 |
| 1995 | 12 | 0 |
| 1996 | 9 | 0 |
| 1997 | 12 | 0 |
| 1998 | 8 | 0 |
| 1999 | 12 | 0 |
| 2000 | 12 | 0 |
| 2001 | 14 | 5 |
| 2002 | 12 | 15 |
| 2003 | 6 | 12 |
| 2004 | 12 | 24 |
| 2005 | 12 | 45 |
| 2006 | 28 | 37 |
| 2007 | 35 | 26 |
| 2008 | 38 | 59 |
| 2009 | 21 | 23 |
| 2010 | 20 | 20 |
| 2011 | 13 | 8 |
| 2012 | 6 | 11 |
| 2013 | 5 | 7 |
| 2014 | 7 | 5 |
| 2015 | 10 | 10 |
| 2016 | 5 | 5 |
| 2017 | 6 | 7 |
| 2018 | 7 | 10 |
| 2019 | 7 | 13 |
| 2020 | 11 | 4 |
| 2021 | 7 | 14 |
| 2022 | 11 | 10 |
| 2023 | 9 | 12 |
| 2024 | 12 | 12 |
| 2025 | 8 | 9 |
| 2026 | 0 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Vertical probe array having sliding contacts in elastic guide plate14 Oct 2025US 12,442,834 B2FormFactor, Inc.
- Flexible probe for MicroLED defect detection and manufacturing method therefor16 Sep 2025US 12,416,685 B2Institute of Flexible Electronics Technology of Thu, Zhejiang
- Probe card device5 Aug 2025US 12,379,399 B2Princo Corp.
- Apparatus for probing device-under-test1 Jul 2025US 12,345,760 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Flexible membrane adapted to carry high-frequency (RF) power signals and corresponding probe card for the high-frequency (RF) power test of electronic devices6 May 2025US 12,292,457 B2Technoprobe S.P.A.
- Semiconductor test device and manufacturing method thereof20 Aug 2026US 2026/0243802 A1Olum Material Corporation
- Probe card and method for inspecting light emitting element2 Jul 2026US 2026/0186022 A1LG Display Co., Ltd.
- Method and device for electrically contacting of electronic components25 Jun 2026US 2026/0181267 A1ams-OSRAM International GmbH
- Test device and manufacturing method thereof4 Jun 2026US 2026/0153535 A1Innolux Corporation
- Anisotropic conductive sheet, electrical inspection device, and electrical inspection method14 May 2026US 2026/0133230 A1Mitsui Chemicals, Inc.
Most cited
By later US patents
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992
- Micromachined semiconductor probe card280US 5,172,050 AMotorola, Inc. · 1992
- Method of making a flexible tester surface for testing integrated circuits253US 5,020,219 A1991
- Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die241US 5,686,317 AMicron Technology, Inc. · 1997
- Method for fabrication of probe card for testing of semiconductor devices216US 5,225,037 ATexas Instruments Incorporated · 1993