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US 2026/0153535 A1Published application
Test device and manufacturing method thereof
AssigneeInnolux Corporation
InventorsChin-Lung TING, Kuang-Ming FAN, Lung-Shu HUANG
Life of this patent
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Abstract
A test device includes a flexible detecting film and a supporting layer. The supporting layer supports the flexible detecting film. The flexible detecting film includes at least one probe and at least one first component, the first component overlaps the probe, the first component is disposed between the probe and the supporting layer, the flexible detecting film includes an organic material, and an elongation ratio of the organic material is greater than an elongation ratio of the supporting layer.
Claims20
A test device, comprising:
- a flexible detecting film;
- and
- a supporting layer supporting the flexible detecting film;
- wherein the flexible detecting film comprises at least one probe and at least one first component, the at least one first component overlaps the at least one probe, the at least one first component is disposed between the at least one probe and the supporting layer, the flexible detecting film comprises an organic material, and an elongation ratio of the organic material is greater than an elongation ratio of the supporting layer.
1 more element
A manufacturing method of a test device, comprising following steps:
- providing a first carrier board;
- forming at least one insulating layer and at least one conductive layer on the first carrier board to form a film structure, wherein the first carrier board is on a first side of the film structure, the film structure comprises at least one first component, and one of the at least one insulating layer comprises an organic material;
- transferring the film structure from the first carrier board to a second carrier board, wherein the second carrier board is on a second side of the film structure, and the second side and the first side are two opposite sides of the film structure;
- forming at least one probe on the first side of the film structure to form a flexible detecting film comprising the film structure and the at least one probe, wherein the at least one probe overlaps at least a portion of the at least one first component;
- and
- disposing the flexible detecting film on a supporting layer, wherein the at least one first component is disposed between the at least one probe and the supporting layer.
3 more elements
Dependencies are inferred from the claim text.