G01Q 70/14
Particular materials
G01Q70/14 (Particular materials) appears on 155 US grants and 149 published applications in this corpus.
Search patents in G01Q- Granted patents
- 155
- Published applications
- 149
- Assignees
- 135
- Inventors
- 469
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 3 | 0 |
| 1992 | 2 | 0 |
| 1993 | 6 | 0 |
| 1994 | 2 | 0 |
| 1995 | 4 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 7 | 0 |
| 2000 | 4 | 0 |
| 2001 | 1 | 2 |
| 2002 | 1 | 0 |
| 2003 | 3 | 2 |
| 2004 | 1 | 2 |
| 2005 | 1 | 2 |
| 2006 | 1 | 5 |
| 2007 | 4 | 11 |
| 2008 | 1 | 7 |
| 2009 | 10 | 6 |
| 2010 | 3 | 3 |
| 2011 | 3 | 4 |
| 2012 | 4 | 6 |
| 2013 | 7 | 2 |
| 2014 | 5 | 6 |
| 2015 | 3 | 5 |
| 2016 | 6 | 6 |
| 2017 | 7 | 7 |
| 2018 | 8 | 9 |
| 2019 | 8 | 9 |
| 2020 | 7 | 10 |
| 2021 | 13 | 14 |
| 2022 | 6 | 7 |
| 2023 | 11 | 5 |
| 2024 | 4 | 8 |
| 2025 | 0 | 5 |
| 2026 | 3 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Scanning probe microscope9 Jun 2026US 12,650,585 B2Hitachi, Ltd.
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Controlled creation of sub-50 nm defects in 2D materials at low temperature19 May 2026US 12,631,666 B2University of Central Florida Research Foundation, Inc.
- Nanoscale scanning sensors17 Dec 2024US 12,169,209 B2President and Fellows of Harvard College
- Rugged, single crystal wide-band-gap-material scanning-tunneling-microscopy/lithography tips3 Sep 2024US 12,078,654 B2
- Nano-Probe Thermoreflectance Microscopy17 Sep 2026US 2026/0276672 A1Laser Thermal Analysis, Inc.
- Metrology method and associated metrology device6 Aug 2026US 2026/0227426 A1ASML Netherlands B. V.
- A probing device comprising a heat transfer arrangement, a method of manufacturing a probing device, and a method for probing a sample30 Jul 2026US 2026/0219296 A1Teknologian tutkimuskeskus VTT Oy
- Mechanically mediated quantum systems9 Jul 2026US 2026/0195629 A1President and Fellows of Harvard College
- Scanning and micro-mass imaging technology using probe28 May 2026US 2026/0147014 A1Nanchang Hangkong University
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Microcasting of microminiature tips139US 4,916,002 AThe Board of Trustees of the Leland Jr. University · 1990
- Method of making superhard tips for micro-probe microscopy and field emission116US 5,393,647 A1995
- Electromechanical transducer74US 5,780,727 AInternational Business Machines Corporation · 1998
- Method of making superhard mechanical microstructures73US 5,658,710 AAdagio Associates, Inc. · 1997